Thermo Event

[Phe0nix]

My 80mm rear case fan bearings seized causing my onboard LSI controller to die and produce IOC faults . I corrected this by
installing a LSI HBA card ( disabled the onboard in BIOS ) and brought my system back online and after 2 days of running the
server i had a critical notification.

CRITICAL​

Device: /dev/da1 [SAT], 4 Currently unreadable (pending) sectors.​

Sun, 9 Oct 2022 11:01:18 AM (America/New_York)

So i ran a self test and got another Critical notification .

CRITICAL​

Device: /dev/da1 [SAT], Self-Test Log error count increased from 0 to 1.​

Tue, 11 Oct 2022 05:04:15 PM (America/New_York)

Here are the test results

If Selective self-test is pending on power-up, resume after 0 minute delay.

root@freenas:~ # smartctl -a /dev/da1
smartctl 7.0 2018-12-30 r4883 [FreeBSD 11.3-RELEASE-p14 amd64] (local build)
Copyright (C) 2002-18, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family: Western Digital Red
Device Model: WDC WD30EFRX-68EUZN0
Serial Number: WD-WMC4N0G7E98K
LU WWN Device Id: 5 0014ee 6afcb580b
Firmware Version: 82.00A82
User Capacity: 3,000,592,982,016 bytes [3.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Oct 12 01:05:39 2022 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 115) The previous self-test completed having
the read element of the test failed.
Total time to complete Offline
data collection: (39600) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 398) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x703d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 1091
3 Spin_Up_Time 0x0027 181 173 021 Pre-fail Always - 5941
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 256
5 Reallocated_Sector_Ct 0x0033 198 198 140 Pre-fail Always - 60
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 037 037 000 Old_age Always - 46428
10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 256
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 253
193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 553
194 Temperature_Celsius 0x0022 119 106 000 Old_age Always - 31
196 Reallocated_Event_Count 0x0032 160 160 000 Old_age Always - 40
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 4
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 28

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed: read failure 30% 46420 4122130152

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing

I've read another post where a user had similar results after months of critical sector errors and his results came back similar
to mine and was told that alot can change in 3 months .

My "Current_Pending_Sector " has a raw value of 4 but yet "No Errors Were Logged" additionally it states :

SMART overall-health self-assessment test result: PASSED

I found a thread that pointed to this article on fixing bad blocks and i'm not sure if i need to or not ?
If that even works and if i even need to do it. I'm unsure about the 1 command he ran :

dd if=/dev/zero of=/dev/ada3 bs=512 count=1 seek=3082982872

I'm unsure about what sector size i need to use and the count . He has 1 currently unreadable sector and i have 4 so i
think i need to change it to 4 ?
I'm also not certain what sector size to use. I only see one reference to Sector size and that is 512 . The seek was
obvious, i guess the sector size would be too but i want to be 100% certain.