warriorcookie
Explorer
- Joined
- Apr 17, 2017
- Messages
- 67
Hello, I got a degraded status error today, looking for some assistance in checking what's wrong before I throw parts at a problem.
This disk is part of a special vdev mirror for metadata.
I've started a scrub, waiting for it to finish, will post results then.
iostat:
Smart (~11TBW) :
This disk is part of a special vdev mirror for metadata.
I've started a scrub, waiting for it to finish, will post results then.
CRITICAL
Pool Data1 state is DEGRADED: One or more devices has experienced an error resulting in data corruption. Applications may be affected.
The following devices are not healthy:
- Disk ATA Samsung SSD 870 ***SERIAL**** is DEGRADED
- Disk 9160991739036178900 is DEGRADED
iostat:
Code:
# zpool iostat -v
capacity operations bandwidth
pool alloc free read write read write
-------------------------------------- ----- ----- ----- ----- ----- -----
ChaCha 14.1T 481G 1 0 75.5K 6
gptid/f0795930-f96a-11eb-a8d2-005056a3ab54 7.03T 239G 0 0 37.9K 2
gptid/f25d8c41-f96a-11eb-a8d2-005056a3ab54 7.03T 241G 0 0 37.6K 3
-------------------------------------- ----- ----- ----- ----- ----- -----
Data1 11.1T 4.35T 25 110 2.11M 5.36M
mirror 2.51T 1.12T 4 4 443K 678K
gptid/6bc04c74-3407-11eb-8139-005056a3ab54 - - 2 2 222K 339K
gptid/de86f85c-3450-11eb-8139-005056a3ab54 - - 2 2 221K 339K
mirror 2.69T 955G 4 4 452K 610K
gptid/c45a1d29-31cc-11eb-8139-005056a3ab54 - - 2 2 226K 305K
gptid/857ea31d-6b80-11ea-b546-000c29306b8a - - 2 2 226K 305K
mirror 2.79T 868G 3 4 450K 649K
gptid/de0e1bec-86b1-11ea-8be8-005056a3ab54 - - 1 2 226K 325K
gptid/ded789dc-31a0-11eb-8139-005056a3ab54 - - 1 2 224K 325K
mirror 2.42T 1.21T 3 4 457K 724K
gptid/541d4cd3-3686-11eb-81ca-005056a3ab54 - - 1 2 229K 362K
gptid/445e4bfa-3718-11eb-81ca-005056a3ab54 - - 1 2 227K 362K
special - - - - - -
mirror 678G 250G 9 91 354K 2.76M
gptid/710ffff0-500a-11ec-9d21-005056a3ab54 - - 4 45 178K 1.38M
da9 - - 4 45 176K 1.38M
-------------------------------------- ----- ----- ----- ----- ----- -----
boot-pool 1.42G 30.1G 0 0 1.87K 243
da0p2 1.42G 30.1G 0 0 1.87K 243
-------------------------------------- ----- ----- ----- ----- ----- -----Smart (~11TBW) :
Code:
smartctl -a /dev/da11
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE-p11 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: Samsung SSD 870 EVO 1TB
Serial Number: ***SERIAL***
LU WWN Device Id: 5 002538 f316058b2
Firmware Version: SVT01B6Q
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Feb 10 14:35:39 2022 CST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 1761
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 32
177 Wear_Leveling_Count 0x0013 098 098 000 Pre-fail Always - 38
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0
181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0032 073 061 000 Old_age Always - 27
195 Hardware_ECC_Recovered 0x001a 200 200 000 Old_age Always - 0
199 UDMA_CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0
235 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 7
241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 21932635884
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 1761 -
# 2 Short offline Completed without error 00% 1747 -
# 3 Extended offline Completed without error 00% 1702 -
# 4 Short offline Completed without error 00% 1699 -
# 5 Short offline Completed without error 00% 1651 -
# 6 Short offline Completed without error 00% 1603 -
# 7 Short offline Completed without error 00% 1555 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
256 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.