warriorcookie
Explorer
- Joined
- Apr 17, 2017
- Messages
- 67
Hello, I got a degraded status error today, looking for some assistance in checking what's wrong before I throw parts at a problem.
This disk is part of a special vdev mirror for metadata.
I've started a scrub, waiting for it to finish, will post results then.
iostat:
Smart (~11TBW) :
This disk is part of a special vdev mirror for metadata.
I've started a scrub, waiting for it to finish, will post results then.
CRITICAL
Pool Data1 state is DEGRADED: One or more devices has experienced an error resulting in data corruption. Applications may be affected.
The following devices are not healthy:
- Disk ATA Samsung SSD 870 ***SERIAL**** is DEGRADED
- Disk 9160991739036178900 is DEGRADED
iostat:
Code:
# zpool iostat -v capacity operations bandwidth pool alloc free read write read write -------------------------------------- ----- ----- ----- ----- ----- ----- ChaCha 14.1T 481G 1 0 75.5K 6 gptid/f0795930-f96a-11eb-a8d2-005056a3ab54 7.03T 239G 0 0 37.9K 2 gptid/f25d8c41-f96a-11eb-a8d2-005056a3ab54 7.03T 241G 0 0 37.6K 3 -------------------------------------- ----- ----- ----- ----- ----- ----- Data1 11.1T 4.35T 25 110 2.11M 5.36M mirror 2.51T 1.12T 4 4 443K 678K gptid/6bc04c74-3407-11eb-8139-005056a3ab54 - - 2 2 222K 339K gptid/de86f85c-3450-11eb-8139-005056a3ab54 - - 2 2 221K 339K mirror 2.69T 955G 4 4 452K 610K gptid/c45a1d29-31cc-11eb-8139-005056a3ab54 - - 2 2 226K 305K gptid/857ea31d-6b80-11ea-b546-000c29306b8a - - 2 2 226K 305K mirror 2.79T 868G 3 4 450K 649K gptid/de0e1bec-86b1-11ea-8be8-005056a3ab54 - - 1 2 226K 325K gptid/ded789dc-31a0-11eb-8139-005056a3ab54 - - 1 2 224K 325K mirror 2.42T 1.21T 3 4 457K 724K gptid/541d4cd3-3686-11eb-81ca-005056a3ab54 - - 1 2 229K 362K gptid/445e4bfa-3718-11eb-81ca-005056a3ab54 - - 1 2 227K 362K special - - - - - - mirror 678G 250G 9 91 354K 2.76M gptid/710ffff0-500a-11ec-9d21-005056a3ab54 - - 4 45 178K 1.38M da9 - - 4 45 176K 1.38M -------------------------------------- ----- ----- ----- ----- ----- ----- boot-pool 1.42G 30.1G 0 0 1.87K 243 da0p2 1.42G 30.1G 0 0 1.87K 243 -------------------------------------- ----- ----- ----- ----- ----- -----
Smart (~11TBW) :
Code:
smartctl -a /dev/da11 smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE-p11 amd64] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: Samsung SSD 870 EVO 1TB Serial Number: ***SERIAL*** LU WWN Device Id: 5 002538 f316058b2 Firmware Version: SVT01B6Q User Capacity: 1,000,204,886,016 bytes [1.00 TB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Thu Feb 10 14:35:39 2022 CST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 85) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0 9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 1761 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 32 177 Wear_Leveling_Count 0x0013 098 098 000 Pre-fail Always - 38 179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0 181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0 182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0 183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0 190 Airflow_Temperature_Cel 0x0032 073 061 000 Old_age Always - 27 195 Hardware_ECC_Recovered 0x001a 200 200 000 Old_age Always - 0 199 UDMA_CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0 235 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 7 241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 21932635884 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 1761 - # 2 Short offline Completed without error 00% 1747 - # 3 Extended offline Completed without error 00% 1702 - # 4 Short offline Completed without error 00% 1699 - # 5 Short offline Completed without error 00% 1651 - # 6 Short offline Completed without error 00% 1603 - # 7 Short offline Completed without error 00% 1555 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 256 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.