GBillR
Contributor
- Joined
- Jun 12, 2016
- Messages
- 189
So this is behavior that I haven't seen before, and I am wondering if anyone else has.
A remote server alerted via email to failed SMART test for a particular drive. Relatively young drive (still within warranty period), but I've had drives fail before, so not completly unheard of obviously. I increased the SMART test interval to daily short and weekly long, and also increased the scrub periodicity to daily until I could get to the server to replace the drive. I pulled the drive last week and figured I would benchtest prior to RMA on my ubuntu 16.04 system via esata dock. Now, the SMART tests pass (short and long), and a -ws badblocks completed without error.
Has anyone ever seen a drive suddenly pass SMART tests after failing so many at the exact same spot on the drive? I would be suspicious of the sata cable, but the error occured at the exact same location each test (as I interpret the data anyway). FreeNAS never complained about the volume, only the SMART test failure count. The replacement drive (same cable) has had no issues. Maybe I don't understand what I am reading in the results. I don't see how I could trust the drive in production again... although it has been so long since I've had to RMA a drive, I'm not even sure this would meet their criteria. Any other testing I could do to try to stress the drive? Thoughts on the SMART data? The only abnormal info (beyond the failed tests) that I see in the SMART data is the line below. Based on my limited search, I'm not sure this is related, or if this is just a Ubuntu 16.04 bug.
Full readout here:
Thanks, -Bill
A remote server alerted via email to failed SMART test for a particular drive. Relatively young drive (still within warranty period), but I've had drives fail before, so not completly unheard of obviously. I increased the SMART test interval to daily short and weekly long, and also increased the scrub periodicity to daily until I could get to the server to replace the drive. I pulled the drive last week and figured I would benchtest prior to RMA on my ubuntu 16.04 system via esata dock. Now, the SMART tests pass (short and long), and a -ws badblocks completed without error.
Has anyone ever seen a drive suddenly pass SMART tests after failing so many at the exact same spot on the drive? I would be suspicious of the sata cable, but the error occured at the exact same location each test (as I interpret the data anyway). FreeNAS never complained about the volume, only the SMART test failure count. The replacement drive (same cable) has had no issues. Maybe I don't understand what I am reading in the results. I don't see how I could trust the drive in production again... although it has been so long since I've had to RMA a drive, I'm not even sure this would meet their criteria. Any other testing I could do to try to stress the drive? Thoughts on the SMART data? The only abnormal info (beyond the failed tests) that I see in the SMART data is the line below. Based on my limited search, I'm not sure this is related, or if this is just a Ubuntu 16.04 bug.
Code:
Read SMART Thresholds failed: scsi error badly formed scsi parameters
Full readout here:
Code:
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Red
Device Model: WDC WD20EFRX-68EUZN0
Serial Number: WD-
LU WWN Device Id: 5 0014ee 20f4712a4
Firmware Version: 82.00A82
User Capacity: 2,000,398,934,016 bytes [2.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.0, 3.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Mon May 20 23:10:49 2019 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
Read SMART Thresholds failed: scsi error badly formed scsi parameters
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (25800) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 261) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x703d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 --- Pre-fail Always - 0
3 Spin_Up_Time 0x0027 174 173 --- Pre-fail Always - 4275
4 Start_Stop_Count 0x0032 100 100 --- Old_age Always - 18
5 Reallocated_Sector_Ct 0x0033 200 200 --- Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 200 200 --- Old_age Always - 0
9 Power_On_Hours 0x0032 084 084 --- Old_age Always - 12347
10 Spin_Retry_Count 0x0032 100 253 --- Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 253 --- Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 --- Old_age Always - 18
192 Power-Off_Retract_Count 0x0032 200 200 --- Old_age Always - 1
193 Load_Cycle_Count 0x0032 200 200 --- Old_age Always - 174
194 Temperature_Celsius 0x0022 106 106 --- Old_age Always - 41
196 Reallocated_Event_Count 0x0032 200 200 --- Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 --- Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 253 --- Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 --- Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 200 200 --- Old_age Offline - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 12347 -
# 2 Short offline Completed without error 00% 12314 -
# 3 Short offline Completed: read failure 10% 12301 3907025624
# 4 Short offline Completed: read failure 20% 12277 3907025624
# 5 Short offline Completed: read failure 20% 12253 3907025624
# 6 Short offline Completed: read failure 60% 12229 3907025624
# 7 Short offline Completed: read failure 10% 12205 3907025624
# 8 Extended offline Completed: read failure 10% 12188 3907025624
# 9 Short offline Completed: read failure 10% 12181 3907025624
#10 Short offline Completed: read failure 10% 12157 3907025624
#11 Short offline Completed: read failure 20% 12133 3907025624
#12 Short offline Completed: read failure 40% 12109 3907025624
#13 Short offline Completed: read failure 10% 12085 3907025624
#14 Short offline Completed: read failure 60% 12061 3907025624
#15 Short offline Completed: read failure 60% 12037 3907025624
#16 Extended offline Completed: read failure 10% 12019 3907025624
#17 Short offline Completed: read failure 60% 12013 3907025624
#18 Short offline Completed: read failure 60% 11990 3907025624
#19 Short offline Completed: read failure 60% 11966 3907025624
#20 Short offline Completed: read failure 10% 11942 3907025624
#21 Short offline Completed: read failure 20% 11918 3907025624
19 of 19 failed self-tests are outdated by newer successful extended offline self-test # 1
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.Thanks, -Bill