Interpreting Smart Results

[adamjs83]

I am using a SUPERMICRO MBD-X10SL7-F for me freenas box. I have 6 identical white label 6tb hard drives. Four of them are connected to the LSI controller and the other two are connected to the mobo controller. When I first installed the drives and ran the smart short and long tests the four drives connected to the LSI passed with flying colors and two connected to the mobo failed with errors. I then ran bad blocks on all drives for several days and no error were reported. I then ran short and long tests on all six drives and they all passed. One of the mobo drives is showing a reallocated sector count of 61. Does this drive need to be replaced? Smart results on the drive in question are below:

Code:

=== START OF INFORMATION SECTION ===
Device Model:     WL6000GSA6457
Serial Number:    XXXXXXXXXXXXX
LU WWN Device Id: 0 000000 000000000
Firmware Version: 01.00F.3
User Capacity:    6,001,424,400,384 bytes [6.00 TB]
Sector Sizes:     512 bytes logical, 4096 bytes physical
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   ATA8-ACS (minor revision not indicated)
Local Time is:    Thu Sep 17 16:22:58 2015 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00) Offline data collection activity
                                        was never started.
                                        Auto Offline Data Collection: Disabled.
Self-test execution status:      ( 249) Self-test routine in progress...
                                        90% of test remaining.
Total time to complete Offline
data collection:                ( 2624) seconds.
Offline data collection
capabilities:                    (0x5b) SMART execute Offline immediate.
                                        Auto Offline data collection on/off support.
                                        Suspend Offline collection upon new
                                        command.
                                        Offline surface scan supported.
                                        Self-test supported.
                                        No Conveyance Self-test supported.
                                        Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        General Purpose Logging supported.
Short self-test routine
recommended polling time:        (   2) minutes.
Extended self-test routine
recommended polling time:        ( 680) minutes.
SCT capabilities:              (0x3035) SCT Status supported.
                                        SCT Feature Control supported.
                                        SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   200   200   051    Pre-fail  Always       -       0
  3 Spin_Up_Time            0x0027   100   253   021    Pre-fail  Always       -       0
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       1
  5 Reallocated_Sector_Ct   0x0033   199   199   140    Pre-fail  Always       -       61
  7 Seek_Error_Rate         0x002f   200   200   051    Pre-fail  Always       -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       162
10 Spin_Retry_Count        0x0033   100   253   051    Pre-fail  Always       -       0
11 Calibration_Retry_Count 0x0032   100   253   051    Old_age   Always       -       0
12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       1
184 End-to-End_Error        0x0033   100   100   097    Pre-fail  Always       -       0
187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always       -       0
188 Command_Timeout         0x0032   100   100   000    Old_age   Always       -       0
190 Airflow_Temperature_Cel 0x0022   062   056   000    Old_age   Always       -       38
192 Power-Off_Retract_Count 0x0032   200   200   000    Old_age   Always       -       0
193 Load_Cycle_Count        0x0032   200   200   000    Old_age   Always       -       0
194 Temperature_Celsius     0x0022   114   108   000    Old_age   Always       -       38
195 Hardware_ECC_Recovered  0x0036   200   200   000    Old_age   Always       -       0
196 Reallocated_Event_Count 0x0032   197   197   000    Old_age   Always       -       3
197 Current_Pending_Sector  0x0032   200   200   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   100   253   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0032   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x0009   200   200   051    Pre-fail  Offline      -       0

SMART Error Log Version: 1
ATA Error Count: 2
        CR = Command Register [HEX]
        FR = Features Register [HEX]
        SC = Sector Count Register [HEX]
        SN = Sector Number Register [HEX]
        CL = Cylinder Low Register [HEX]
        CH = Cylinder High Register [HEX]
        DH = Device/Head Register [HEX]
        DC = Device Command Register [HEX]
        ER = Error register [HEX]
        ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 2 occurred at disk power-on lifetime: 265 hours (11 days + 1 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 a2 51 5e 90 e0  Error: UNC 162 sectors at LBA = 0x00905e51 = 9461329

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 08 a8 5e 90 e0 08   5d+05:12:31.841  READ DMA
  c8 00 08 b0 5e 90 e0 08   5d+05:12:31.831  READ DMA
  c8 00 08 b8 5e 90 e0 08   5d+05:12:31.820  READ DMA
  c8 00 08 c0 5e 90 e0 08   5d+05:12:31.810  READ DMA
  c8 00 08 c8 5e 90 e0 08   5d+05:12:31.800  READ DMA

Error 1 occurred at disk power-on lifetime: 265 hours (11 days + 1 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 a2 51 5e 90 e0  Error: UNC 162 sectors at LBA = 0x00905e51 = 9461329

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 00 60 5e 90 e0 08   5d+05:12:27.474  READ DMA
  c8 00 00 60 5c 90 e0 08   5d+05:12:27.474  READ DMA
  c8 00 10 e0 7d 09 e0 08   5d+05:12:27.392  READ DMA
  ca 00 08 80 06 4c e0 08   5d+05:12:26.163  WRITE DMA

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Extended offline    Completed without error       00%       155         -
# 2  Extended offline    Completed without error       00%       106         -
# 3  Extended offline    Completed: read failure       90%         0         9436752
# 4  Short offline       Completed: read failure       40%         0         9436752
2 of 2 failed self-tests are outdated by newer successful extended offline self-test # 1

SMART Selective self-test log data structure revision number 1
SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

 

[hugovsky]

I would say that your drive has born dead. You have a failed test with 0 hours lifetime. But it's strange that you can't see errors now. Let some more users check your data to confirm.

 

[cyberjock]

Looks like the drive had a few bad sectors right out of the gate, but remapped them to spare area on the disk. So the issue is fixed. I would run badblocks on that drive and see if it passes or fails. If it fails, do an RMA/return. This disk is probably going to have a short life no matter what.. :/

 

[DrKK]

Sorry for being a pain, by why in the hell would you connect 4 drives to the LSI controller? Whenever possible, you should connect every single drive to the standard C22x chipset SATA ports. Thus, for 6 or fewer drives (which sounds like you) you would never use the LSI ([edit]) ports.

 

[danb35]

Thus, for 6 or fewer drives (which sounds like you) you would never use the Marvell ports.

What Marvell ports? Marvell != LSI. Though I agree there's no need, or even benefit, to use the LSI ports in this case (SATA3 doesn't buy you anything over SATA2 for spinning rust).

 

[DrKK]

What Marvell ports? Marvell != LSI. Though I agree there's no need, or even benefit, to use the LSI ports in this case (SATA3 doesn't buy you anything over SATA2 for spinning rust).

You're right danb. Lol. I am 98% of the time having this discussion with people that have the board with the Marvell ports that it was simply muscle memory. Thanks for the correction.

 

[DrKK]

I'm sure the logic is: "Oh, there's only a couple SATA3 speed ports on the motherboard ports, so I'll use those, and then, I'll use the 'fast' ports on the LSI for the other drives, so everything is as fast as possible."

Problem being, of course, that this is a ridiculous idea, since even the SATA2 ports are already a zillion times faster than any spinning rust can keep up with.

 

[Ericloewe]

I'm sure the logic is: "Oh, there's only a couple SATA3 speed ports on the motherboard ports, so I'll use those, and then, I'll use the 'fast' ports on the LSI for the other drives, so everything is as fast as possible."

Problem being, of course, that this is a ridiculous idea, since even the SATA2 ports are already a zillion times faster than any spinning rust can keep up with.

Sure, but an SAS2008 or SAS2308 can easily compete with Intel's SATA implementation and are backed by wider buses than the PCH (which also has USB and other stuff tacked on), since the X10SL7-F routes 8x PCI-e 3.0 straight from the CPU to the SAS2308.

It probably won't make a positive difference, but it won't hurt. Using the PCH only might save the ~10W for the SAS2308, but that might not be the case (someone with the X10SL7-F would have to measure it).

Anything other than LSI vs. Intel and there is no contest. Intel PCH wins. Hell, Intel ICH10R, from when Core 2 reigned supreme, handily beats most SATA3 controllers out there despite only being a SATA2 controller.

 

[adamjs83]

Sorry for being a pain, by why in the hell would you connect 4 drives to the LSI controller? Whenever possible, you should connect every single drive to the standard C22x chipset SATA ports. Thus, for 6 or fewer drives (which sounds like you) you would never use the LSI ([edit]) ports.

I have a total of 10 drives in my system. There is also an array of 4 ssd drives which I am using as my SAN. I have the 4 SSD drives on the LSI and the spinning disks I first put on the the remaining LSI ports and then on the mobo ports. I didn't realize there was any downside to using the LSI controller first as it has faster port speeds. My n00b intuition was to start there. You live and you learn.

So with two arrays, one of 4 SSDs for VM storage and another of 6 spinning drives for media, iso, personal files, etc how would you suggest making use of the ports?

Side note, can I move the drive around now without breaking my pools? If I can't its not a big deal as I am still in testing in Freenas and all the data is still elsewhere.

 

[danb35]

There's no downside to using the LSI controller, there's just no upside to it either for mechanical drives. With what was stated earlier, all we knew was that you had two drives on the Intel ports, and four more on the LSI ports. Not harmful, just odd, and no obvious reason to do it. With the revelation that there are another four devices filling out the Intel ports, it makes more sense.

Side note, can I move the drive around now without breaking my pools?

Sure can.

 

[adamjs83]

There's no downside to using the LSI controller, there's just no upside to it either for mechanical drives. With what was stated earlier, all we knew was that you had two drives on the Intel ports, and four more on the LSI ports. Not harmful, just odd, and no obvious reason to do it. With the revelation that there are another four devices filling out the Intel ports, it makes more sense.


Sure can.

Just power down and move the cables, just like that?

 

[adamjs83]

With the revelation that there are another four devices filling out the Intel ports, it makes more sense.


Sure can.

See update to my post above, I actually have the 4 SSD's on the LSI as well.

 

[danb35]

Just power down and move the cables, just like that?

Just like that.