Is it time to replace my 2 smart error drives?

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sesipod

Contributor
Joined
Jan 27, 2017
Messages
162
Wondering if these errors are serious enough to get replacement drives ordered ASAP ?

  • DA6

Code:
root@nas:~ # smartctl -a -q noserial /dev/da6
smartctl 6.6 2017-11-05 r4594 [FreeBSD 11.1-STABLE amd64] (local build)
Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:	 Western Digital Red
Device Model:	 WDC WD30EFRX-68EUZN0
Firmware Version: 80.00A80
User Capacity:	3,000,592,982,016 bytes [3.00 TB]
Sector Sizes:	 512 bytes logical, 4096 bytes physical
Rotation Rate:	5400 rpm
Device is:		In smartctl database [for details use: -P show]
ATA Version is:   ACS-2 (minor revision not indicated)
SATA Version is:  SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is:	Sun Oct 14 01:47:12 2018 PDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x84) Offline data collection activity
										was suspended by an interrupting command from host.
										Auto Offline Data Collection: Enabled.
Self-test execution status:	  (   0) The previous self-test routine completed
										without error or no self-test has ever
										been run.
Total time to complete Offline
data collection:				(40500) seconds.
Offline data collection
capabilities:					(0x7b) SMART execute Offline immediate.
										Auto Offline data collection on/off support.
										Suspend Offline collection upon new
										command.
										Offline surface scan supported.
										Self-test supported.
										Conveyance Self-test supported.
										Selective Self-test supported.
SMART capabilities:			(0x0003) Saves SMART data before entering
										power-saving mode.
										Supports SMART auto save timer.
Error logging capability:		(0x01) Error logging supported.
										General Purpose Logging supported.
Short self-test routine
recommended polling time:		(   2) minutes.
Extended self-test routine
recommended polling time:		( 406) minutes.
Conveyance self-test routine
recommended polling time:		(   5) minutes.
SCT capabilities:			  (0x703d) SCT Status supported.
										SCT Error Recovery Control supported.
										SCT Feature Control supported.
										SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME		  FLAG	 VALUE WORST THRESH TYPE	  UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate	 0x002f   200   200   051	Pre-fail  Always	   -	   0
  3 Spin_Up_Time			0x0027   181   177   021	Pre-fail  Always	   -	   5908
  4 Start_Stop_Count		0x0032   100   100   000	Old_age   Always	   -	   214
  5 Reallocated_Sector_Ct   0x0033   200   200   140	Pre-fail  Always	   -	   0
  7 Seek_Error_Rate		 0x002e   200   200   000	Old_age   Always	   -	   0
  9 Power_On_Hours		  0x0032   049   049   000	Old_age   Always	   -	   37870
 10 Spin_Retry_Count		0x0032   100   100   000	Old_age   Always	   -	   0
 11 Calibration_Retry_Count 0x0032   100   100   000	Old_age   Always	   -	   0
 12 Power_Cycle_Count	   0x0032   100   100   000	Old_age   Always	   -	   186
192 Power-Off_Retract_Count 0x0032   200   200   000	Old_age   Always	   -	   179
193 Load_Cycle_Count		0x0032   199   199   000	Old_age   Always	   -	   4283
194 Temperature_Celsius	 0x0022   112   107   000	Old_age   Always	   -	   38
196 Reallocated_Event_Count 0x0032   200   200   000	Old_age   Always	   -	   0
197 Current_Pending_Sector  0x0032   200   200   000	Old_age   Always	   -	   0
198 Offline_Uncorrectable   0x0030   200   200   000	Old_age   Offline	  -	   0
199 UDMA_CRC_Error_Count	0x0032   200   200   000	Old_age   Always	   -	   0
200 Multi_Zone_Error_Rate   0x0008   200   200   000	Old_age   Offline	  -	   0

SMART Error Log Version: 1
ATA Error Count: 10 (device log contains only the most recent five errors)
		CR = Command Register [HEX]
		FR = Features Register [HEX]
		SC = Sector Count Register [HEX]
		SN = Sector Number Register [HEX]
		CL = Cylinder Low Register [HEX]
		CH = Cylinder High Register [HEX]
		DH = Device/Head Register [HEX]
		DC = Device Command Register [HEX]
		ER = Error register [HEX]
		ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 10 occurred at disk power-on lifetime: 2469 hours (102 days + 21 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 01 00 00 00 00  Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  b0 d5 01 e1 4f c2 00 08   6d+01:59:30.555  SMART READ LOG
  b0 d5 01 e1 4f c2 00 08   6d+01:59:30.555  SMART READ LOG
  b0 d5 01 e1 4f c2 00 08   6d+01:59:30.555  SMART READ LOG
  b0 d6 01 e0 4f c2 00 08   6d+01:59:30.554  SMART WRITE LOG
  b0 d6 01 e0 4f c2 00 08   6d+01:59:30.553  SMART WRITE LOG

Error 9 occurred at disk power-on lifetime: 2469 hours (102 days + 21 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 01 00 00 00 00  Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  b0 d5 01 e1 4f c2 00 08   6d+01:59:30.555  SMART READ LOG
  b0 d5 01 e1 4f c2 00 08   6d+01:59:30.555  SMART READ LOG
  b0 d6 01 e0 4f c2 00 08   6d+01:59:30.554  SMART WRITE LOG
  b0 d6 01 e0 4f c2 00 08   6d+01:59:30.553  SMART WRITE LOG
  b0 d6 01 e0 4f c2 00 08   6d+01:59:30.552  SMART WRITE LOG

Error 8 occurred at disk power-on lifetime: 2157 hours (89 days + 21 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 01 00 00 00 00  Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  b0 d5 01 e1 4f c2 00 08	  00:57:43.540  SMART READ LOG
  b0 d5 01 e1 4f c2 00 08	  00:57:43.539  SMART READ LOG
  b0 d6 01 e0 4f c2 00 08	  00:57:43.539  SMART WRITE LOG
  b0 d6 01 e0 4f c2 00 08	  00:57:43.538  SMART WRITE LOG
  b0 d5 01 e0 4f c2 00 08	  00:57:43.538  SMART READ LOG

Error 7 occurred at disk power-on lifetime: 1306 hours (54 days + 10 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 01 00 00 00 00  Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  b0 d5 01 e1 4f c2 00 08  28d+11:10:15.306  SMART READ LOG
  b0 d5 01 e1 4f c2 00 08  28d+11:10:15.306  SMART READ LOG
  b0 d6 01 e0 4f c2 00 08  28d+11:10:15.305  SMART WRITE LOG
  b0 d6 01 e0 4f c2 00 08  28d+11:10:15.304  SMART WRITE LOG
  b0 d5 01 e0 4f c2 00 08  28d+11:10:15.304  SMART READ LOG

Error 6 occurred at disk power-on lifetime: 1306 hours (54 days + 10 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 01 00 00 00 00  Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  b0 d5 01 e1 4f c2 00 08  28d+11:09:43.472  SMART READ LOG
  b0 d5 01 e1 4f c2 00 08  28d+11:09:43.472  SMART READ LOG
  b0 d6 01 e0 4f c2 00 08  28d+11:09:43.471  SMART WRITE LOG
  b0 d6 01 e0 4f c2 00 08  28d+11:09:43.470  SMART WRITE LOG
  b0 d5 01 e0 4f c2 00 08  28d+11:09:43.470  SMART READ LOG

SMART Self-test log structure revision number 1
Num  Test_Description	Status				  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Short offline	   Completed without error	   00%	 31474		 -
# 2  Short offline	   Completed without error	   00%	 31462		 -
# 3  Short offline	   Completed without error	   00%	 31450		 -
# 4  Short offline	   Completed without error	   00%	 31438		 -
# 5  Short offline	   Completed without error	   00%	 31402		 -
# 6  Short offline	   Completed without error	   00%	 31390		 -
# 7  Short offline	   Completed without error	   00%	 31354		 -
# 8  Short offline	   Completed without error	   00%	 31342		 -
# 9  Short offline	   Completed without error	   00%	 31306		 -
#10  Short offline	   Completed without error	   00%	 31294		 -
#11  Short offline	   Completed without error	   00%	 31258		 -
#12  Short offline	   Completed without error	   00%	 31246		 -
#13  Short offline	   Completed without error	   00%	 31234		 -
#14  Short offline	   Completed without error	   00%	 31222		 -
#15  Short offline	   Completed without error	   00%	 31186		 -
#16  Short offline	   Completed without error	   00%	 31174		 -
#17  Short offline	   Completed without error	   00%	 31138		 -
#18  Short offline	   Completed without error	   00%	 31126		 -
#19  Short offline	   Completed without error	   00%	 31090		 -
#20  Short offline	   Completed without error	   00%	 31079		 -
#21  Short offline	   Completed without error	   00%	 31042		 -

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
	1		0		0  Not_testing
	2		0		0  Not_testing
	3		0		0  Not_testing
	4		0		0  Not_testing
	5		0		0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.







  • DA7

Code:
root@nas:~ # smartctl -a -q noserial /dev/da7
smartctl 6.6 2017-11-05 r4594 [FreeBSD 11.1-STABLE amd64] (local build)
Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:	 Western Digital Red
Device Model:	 WDC WD30EFRX-68EUZN0
Firmware Version: 80.00A80
User Capacity:	3,000,592,982,016 bytes [3.00 TB]
Sector Sizes:	 512 bytes logical, 4096 bytes physical
Rotation Rate:	5400 rpm
Device is:		In smartctl database [for details use: -P show]
ATA Version is:   ACS-2 (minor revision not indicated)
SATA Version is:  SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is:	Sun Oct 14 01:44:28 2018 PDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x84) Offline data collection activity
										was suspended by an interrupting command from host.
										Auto Offline Data Collection: Enabled.
Self-test execution status:	  (   0) The previous self-test routine completed
										without error or no self-test has ever
										been run.
Total time to complete Offline
data collection:				(40320) seconds.
Offline data collection
capabilities:					(0x7b) SMART execute Offline immediate.
										Auto Offline data collection on/off support.
										Suspend Offline collection upon new
										command.
										Offline surface scan supported.
										Self-test supported.
										Conveyance Self-test supported.
										Selective Self-test supported.
SMART capabilities:			(0x0003) Saves SMART data before entering
										power-saving mode.
										Supports SMART auto save timer.
Error logging capability:		(0x01) Error logging supported.
										General Purpose Logging supported.
Short self-test routine
recommended polling time:		(   2) minutes.
Extended self-test routine
recommended polling time:		( 404) minutes.
Conveyance self-test routine
recommended polling time:		(   5) minutes.
SCT capabilities:			  (0x703d) SCT Status supported.
										SCT Error Recovery Control supported.
										SCT Feature Control supported.
										SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME		  FLAG	 VALUE WORST THRESH TYPE	  UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate	 0x002f   200   200   051	Pre-fail  Always	   -	   0
  3 Spin_Up_Time			0x0027   182   178   021	Pre-fail  Always	   -	   5875
  4 Start_Stop_Count		0x0032   100   100   000	Old_age   Always	   -	   214
  5 Reallocated_Sector_Ct   0x0033   200   200   140	Pre-fail  Always	   -	   0
  7 Seek_Error_Rate		 0x002e   200   200   000	Old_age   Always	   -	   0
  9 Power_On_Hours		  0x0032   049   049   000	Old_age   Always	   -	   37871
 10 Spin_Retry_Count		0x0032   100   100   000	Old_age   Always	   -	   0
 11 Calibration_Retry_Count 0x0032   100   100   000	Old_age   Always	   -	   0
 12 Power_Cycle_Count	   0x0032   100   100   000	Old_age   Always	   -	   186
192 Power-Off_Retract_Count 0x0032   200   200   000	Old_age   Always	   -	   179
193 Load_Cycle_Count		0x0032   199   199   000	Old_age   Always	   -	   4287
194 Temperature_Celsius	 0x0022   111   106   000	Old_age   Always	   -	   39
196 Reallocated_Event_Count 0x0032   200   200   000	Old_age   Always	   -	   0
197 Current_Pending_Sector  0x0032   200   200   000	Old_age   Always	   -	   0
198 Offline_Uncorrectable   0x0030   200   200   000	Old_age   Offline	  -	   0
199 UDMA_CRC_Error_Count	0x0032   200   200   000	Old_age   Always	   -	   0
200 Multi_Zone_Error_Rate   0x0008   200   200   000	Old_age   Offline	  -	   0

SMART Error Log Version: 1
ATA Error Count: 7 (device log contains only the most recent five errors)
		CR = Command Register [HEX]
		FR = Features Register [HEX]
		SC = Sector Count Register [HEX]
		SN = Sector Number Register [HEX]
		CL = Cylinder Low Register [HEX]
		CH = Cylinder High Register [HEX]
		DH = Device/Head Register [HEX]
		DC = Device Command Register [HEX]
		ER = Error register [HEX]
		ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 7 occurred at disk power-on lifetime: 2469 hours (102 days + 21 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 01 00 00 00 00  Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  b0 d5 01 e1 4f c2 00 08   6d+01:59:13.092  SMART READ LOG
  b0 d5 01 e1 4f c2 00 08   6d+01:59:13.092  SMART READ LOG
  b0 d6 01 e0 4f c2 00 08   6d+01:59:13.091  SMART WRITE LOG
  b0 d6 01 e0 4f c2 00 08   6d+01:59:13.090  SMART WRITE LOG
  b0 d5 01 e0 4f c2 00 08   6d+01:59:13.090  SMART READ LOG

Error 6 occurred at disk power-on lifetime: 2157 hours (89 days + 21 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 01 00 00 00 00  Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  b0 d5 01 e1 4f c2 00 08	  00:57:50.286  SMART READ LOG
  b0 d5 01 e1 4f c2 00 08	  00:57:50.286  SMART READ LOG
  b0 d6 01 e0 4f c2 00 08	  00:57:50.285  SMART WRITE LOG
  b0 d6 01 e0 4f c2 00 08	  00:57:50.284  SMART WRITE LOG
  b0 d5 01 e0 4f c2 00 08	  00:57:50.284  SMART READ LOG

Error 5 occurred at disk power-on lifetime: 1306 hours (54 days + 10 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 01 00 00 00 00  Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  b0 d5 01 e1 4f c2 00 08  28d+11:10:25.795  SMART READ LOG
  b0 d5 01 e1 4f c2 00 08  28d+11:10:25.795  SMART READ LOG
  b0 d6 01 e0 4f c2 00 08  28d+11:10:25.794  SMART WRITE LOG
  b0 d6 01 e0 4f c2 00 08  28d+11:10:25.793  SMART WRITE LOG
  b0 d5 01 e0 4f c2 00 08  28d+11:10:25.793  SMART READ LOG

Error 4 occurred at disk power-on lifetime: 1306 hours (54 days + 10 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 01 00 00 00 00  Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  b0 d5 01 e1 4f c2 00 08  28d+11:09:05.420  SMART READ LOG
  b0 d5 01 e1 4f c2 00 08  28d+11:09:05.420  SMART READ LOG
  b0 d6 01 e0 4f c2 00 08  28d+11:09:05.419  SMART WRITE LOG
  b0 d6 01 e0 4f c2 00 08  28d+11:09:05.418  SMART WRITE LOG
  b0 d5 01 e0 4f c2 00 08  28d+11:09:05.418  SMART READ LOG

Error 3 occurred at disk power-on lifetime: 1306 hours (54 days + 10 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 01 00 00 00 00  Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  b0 d5 01 e1 4f c2 00 08  28d+11:04:20.596  SMART READ LOG
  b0 d5 01 e1 4f c2 00 08  28d+11:04:20.596  SMART READ LOG
  b0 d6 01 e0 4f c2 00 08  28d+11:04:20.595  SMART WRITE LOG
  b0 d6 01 e0 4f c2 00 08  28d+11:04:20.594  SMART WRITE LOG
  b0 d5 01 e0 4f c2 00 08  28d+11:04:20.594  SMART READ LOG

SMART Self-test log structure revision number 1
Num  Test_Description	Status				  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Short offline	   Completed without error	   00%	 31475		 -
# 2  Short offline	   Completed without error	   00%	 31463		 -
# 3  Short offline	   Completed without error	   00%	 31451		 -
# 4  Short offline	   Completed without error	   00%	 31439		 -
# 5  Short offline	   Completed without error	   00%	 31403		 -
# 6  Short offline	   Completed without error	   00%	 31391		 -
# 7  Short offline	   Completed without error	   00%	 31355		 -
# 8  Short offline	   Completed without error	   00%	 31344		 -
# 9  Short offline	   Completed without error	   00%	 31308		 -
#10  Short offline	   Completed without error	   00%	 31296		 -
#11  Short offline	   Completed without error	   00%	 31260		 -
#12  Short offline	   Completed without error	   00%	 31248		 -
#13  Short offline	   Completed without error	   00%	 31236		 -
#14  Short offline	   Completed without error	   00%	 31224		 -
#15  Short offline	   Completed without error	   00%	 31188		 -
#16  Short offline	   Completed without error	   00%	 31176		 -
#17  Short offline	   Completed without error	   00%	 31140		 -
#18  Short offline	   Completed without error	   00%	 31128		 -
#19  Short offline	   Completed without error	   00%	 31092		 -
#20  Short offline	   Completed without error	   00%	 31080		 -
#21  Short offline	   Completed without error	   00%	 31044		 -

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
	1		0		0  Not_testing
	2		0		0  Not_testing
	3		0		0  Not_testing
	4		0		0  Not_testing
	5		0		0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
 

Jailer

Not strong, but bad
Joined
Sep 12, 2014
Messages
4,977
Run a long smart test on those drives and see what that comes back with.
 

joeschmuck

Old Man
Moderator
Joined
May 28, 2011
Messages
10,994
I agree with my friends here, SMART data does not indicate a drive failure and you need to run routine SMART Long Tests. My advice is a daily Short test and a weekly Long test, just my personal preference.
 

danb35

Hall of Famer
Joined
Aug 16, 2011
Messages
15,504
My advice is a daily Short test and a weekly Long test, just my personal preference.
...and mine as well. The log does show a history of SMART hours, but they're tens of thousands of hours old for both disks--nothing to worry about, IMO.
 

sesipod

Contributor
Joined
Jan 27, 2017
Messages
162
Thank you all for your responses!

What command should I run via terminal to get the long test started at this time. Will the results be sent to my email form FreeNAS ( I just setup email SMTP ) ?

Also is this the correct way of setting up the SMART tests? - Screen Shot 2018-10-15 at 3.45.18 PM.png
 

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Last edited:

danb35

Hall of Famer
Joined
Aug 16, 2011
Messages
15,504
What command should I run via terminal to get the long test started at this time.
smartctl -t long /dev/ada0 (or whatever disk device you need)
Will the results be sent to my email form FreeNAS
No, but you can see them after completion by running smartctl -a /dev/ada0.
 

Ender117

Patron
Joined
Aug 20, 2018
Messages
219
Thank you all for your responses!

What command should I run via terminal to get the long test started at this time. Will the results be sent to my email form FreeNAS ( I just setup email SMTP ) ?

Also is this the correct way of setting up the SMART tests? - Screen Shot 2018-10-15 at 3.45.18 PM.png
It won't send an email. But regular SMART monitoring would look for errors in self-test log and send you email if find one.
 

sesipod

Contributor
Joined
Jan 27, 2017
Messages
162
I just started a Long test on one of the drives that was reporting the errors.
smartctl -t long /dev/da6

We will see in about 6hrs :o
 

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sesipod

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Joined
Jan 27, 2017
Messages
162
So I ran the long test and I guess a short test started after that one. So do I need to disable the short tests and re/run the long test?


Code:
root@nas:~ # smartctl -a /dev/da6
smartctl 6.6 2017-11-05 r4594 [FreeBSD 11.2-STABLE amd64] (local build)
Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:	 Western Digital Red
Device Model:	 WDC WD30EFRX-68EUZN0
Serial Number:	WD-WMC4N2276055
LU WWN Device Id: 5 0014ee 604478841
Firmware Version: 80.00A80
User Capacity:	3,000,592,982,016 bytes [3.00 TB]
Sector Sizes:	 512 bytes logical, 4096 bytes physical
Rotation Rate:	5400 rpm
Device is:		In smartctl database [for details use: -P show]
ATA Version is:   ACS-2 (minor revision not indicated)
SATA Version is:  SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is:	Wed Oct 24 07:09:48 2018 PDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x85) Offline data collection activity
										was aborted by an interrupting command from host.
										Auto Offline Data Collection: Enabled.
Self-test execution status:	  (   0) The previous self-test routine completed
										without error or no self-test has ever
										been run.
Total time to complete Offline
data collection:				(40500) seconds.
Offline data collection
capabilities:					(0x7b) SMART execute Offline immediate.
										Auto Offline data collection on/off support.
										Suspend Offline collection upon new
										command.
										Offline surface scan supported.
										Self-test supported.
										Conveyance Self-test supported.
										Selective Self-test supported.
SMART capabilities:			(0x0003) Saves SMART data before entering
										power-saving mode.
										Supports SMART auto save timer.
Error logging capability:		(0x01) Error logging supported.
										General Purpose Logging supported.
Short self-test routine
recommended polling time:		(   2) minutes.
Extended self-test routine
recommended polling time:		( 406) minutes.
Conveyance self-test routine
recommended polling time:		(   5) minutes.
SCT capabilities:			  (0x703d) SCT Status supported.
										SCT Error Recovery Control supported.
										SCT Feature Control supported.
										SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME		  FLAG	 VALUE WORST THRESH TYPE	  UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate	 0x002f   200   200   051	Pre-fail  Always	   -	   0
  3 Spin_Up_Time			0x0027   181   177   021	Pre-fail  Always	   -	   5908
  4 Start_Stop_Count		0x0032   100   100   000	Old_age   Always	   -	   215
  5 Reallocated_Sector_Ct   0x0033   200   200   140	Pre-fail  Always	   -	   0
  7 Seek_Error_Rate		 0x002e   200   200   000	Old_age   Always	   -	   0
  9 Power_On_Hours		  0x0032   048   048   000	Old_age   Always	   -	   38115
 10 Spin_Retry_Count		0x0032   100   100   000	Old_age   Always	   -	   0
 11 Calibration_Retry_Count 0x0032   100   100   000	Old_age   Always	   -	   0
 12 Power_Cycle_Count	   0x0032   100   100   000	Old_age   Always	   -	   187
192 Power-Off_Retract_Count 0x0032   200   200   000	Old_age   Always	   -	   180
193 Load_Cycle_Count		0x0032   199   199   000	Old_age   Always	   -	   4283
194 Temperature_Celsius	 0x0022   115   107   000	Old_age   Always	   -	   35
196 Reallocated_Event_Count 0x0032   200   200   000	Old_age   Always	   -	   0
197 Current_Pending_Sector  0x0032   200   200   000	Old_age   Always	   -	   0
198 Offline_Uncorrectable   0x0030   200   200   000	Old_age   Offline	  -	   0
199 UDMA_CRC_Error_Count	0x0032   200   200   000	Old_age   Always	   -	   0
200 Multi_Zone_Error_Rate   0x0008   200   200   000	Old_age   Offline	  -	   0

SMART Error Log Version: 1
ATA Error Count: 10 (device log contains only the most recent five errors)
		CR = Command Register [HEX]
		FR = Features Register [HEX]
		SC = Sector Count Register [HEX]
		SN = Sector Number Register [HEX]
		CL = Cylinder Low Register [HEX]
		CH = Cylinder High Register [HEX]
		DH = Device/Head Register [HEX]
		DC = Device Command Register [HEX]
		ER = Error register [HEX]
		ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 10 occurred at disk power-on lifetime: 2469 hours (102 days + 21 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 01 00 00 00 00  Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  b0 d5 01 e1 4f c2 00 08   6d+01:59:30.555  SMART READ LOG
  b0 d5 01 e1 4f c2 00 08   6d+01:59:30.555  SMART READ LOG
  b0 d5 01 e1 4f c2 00 08   6d+01:59:30.555  SMART READ LOG
  b0 d6 01 e0 4f c2 00 08   6d+01:59:30.554  SMART WRITE LOG
  b0 d6 01 e0 4f c2 00 08   6d+01:59:30.553  SMART WRITE LOG

Error 9 occurred at disk power-on lifetime: 2469 hours (102 days + 21 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 01 00 00 00 00  Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  b0 d5 01 e1 4f c2 00 08   6d+01:59:30.555  SMART READ LOG
  b0 d5 01 e1 4f c2 00 08   6d+01:59:30.555  SMART READ LOG
  b0 d6 01 e0 4f c2 00 08   6d+01:59:30.554  SMART WRITE LOG
  b0 d6 01 e0 4f c2 00 08   6d+01:59:30.553  SMART WRITE LOG
  b0 d6 01 e0 4f c2 00 08   6d+01:59:30.552  SMART WRITE LOG

Error 8 occurred at disk power-on lifetime: 2157 hours (89 days + 21 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 01 00 00 00 00  Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  b0 d5 01 e1 4f c2 00 08	  00:57:43.540  SMART READ LOG
  b0 d5 01 e1 4f c2 00 08	  00:57:43.539  SMART READ LOG
  b0 d6 01 e0 4f c2 00 08	  00:57:43.539  SMART WRITE LOG
  b0 d6 01 e0 4f c2 00 08	  00:57:43.538  SMART WRITE LOG
  b0 d5 01 e0 4f c2 00 08	  00:57:43.538  SMART READ LOG

Error 7 occurred at disk power-on lifetime: 1306 hours (54 days + 10 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 01 00 00 00 00  Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  b0 d5 01 e1 4f c2 00 08  28d+11:10:15.306  SMART READ LOG
  b0 d5 01 e1 4f c2 00 08  28d+11:10:15.306  SMART READ LOG
  b0 d6 01 e0 4f c2 00 08  28d+11:10:15.305  SMART WRITE LOG
  b0 d6 01 e0 4f c2 00 08  28d+11:10:15.304  SMART WRITE LOG
  b0 d5 01 e0 4f c2 00 08  28d+11:10:15.304  SMART READ LOG

Error 6 occurred at disk power-on lifetime: 1306 hours (54 days + 10 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 01 00 00 00 00  Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  b0 d5 01 e1 4f c2 00 08  28d+11:09:43.472  SMART READ LOG
  b0 d5 01 e1 4f c2 00 08  28d+11:09:43.472  SMART READ LOG
  b0 d6 01 e0 4f c2 00 08  28d+11:09:43.471  SMART WRITE LOG
  b0 d6 01 e0 4f c2 00 08  28d+11:09:43.470  SMART WRITE LOG
  b0 d5 01 e0 4f c2 00 08  28d+11:09:43.470  SMART READ LOG

SMART Self-test log structure revision number 1
Num  Test_Description	Status				  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Short offline	   Completed without error	   00%	 38108		 -
# 2  Extended offline	Completed without error	   00%	 38100		 -
# 3  Short offline	   Completed without error	   00%	 38084		 -
# 4  Short offline	   Completed without error	   00%	 38072		 -
# 5  Short offline	   Completed without error	   00%	 38060		 -
# 6  Short offline	   Completed without error	   00%	 38048		 -
# 7  Short offline	   Completed without error	   00%	 38036		 -
# 8  Short offline	   Completed without error	   00%	 38025		 -
# 9  Short offline	   Completed without error	   00%	 38013		 -
#10  Short offline	   Completed without error	   00%	 38001		 -
#11  Short offline	   Completed without error	   00%	 37989		 -
#12  Short offline	   Completed without error	   00%	 37977		 -
#13  Short offline	   Completed without error	   00%	 37965		 -
#14  Short offline	   Completed without error	   00%	 37953		 -
#15  Short offline	   Completed without error	   00%	 37941		 -
#16  Short offline	   Completed without error	   00%	 37929		 -
#17  Short offline	   Completed without error	   00%	 37917		 -
#18  Extended offline	Aborted by host			   90%	 37906		 -
#19  Short offline	   Completed without error	   00%	 31474		 -
#20  Short offline	   Completed without error	   00%	 31462		 -
#21  Short offline	   Completed without error	   00%	 31450		 -

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
	1		0		0  Not_testing
	2		0		0  Not_testing
	3		0		0  Not_testing
	4		0		0  Not_testing
	5		0		0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
 
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