jyavenard
Patron
- Joined
- Oct 16, 2013
- Messages
- 361
So I have this quite old drive in my array, almost 10 years old ! (you got to be in awe with the reliability of WD Red really)
From the various numbers, it's all good, no read, seek or re-allocated sectors. It does however have various self-test error not being able to complete. I'm puzzled though that it shows that those occurs a while ago (around 18500 hours), but I don't trust those hours value.
But I got an email
`* Device: /dev/da0 [SAT], Self-Test Log error count increased from 0 to 1.`
supernas% sudo smartctl -a /dev/da0
Password:
Sorry, try again.
Password:
smartctl 7.2 2021-09-14 r5236 [FreeBSD 13.1-RELEASE-p7 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Red
Device Model: WDC WD40EFRX-68WT0N0
Serial Number: WD-WCC4E0281971
LU WWN Device Id: 5 0014ee 2091d4c34
Firmware Version: 80.00A80
User Capacity: 4,000,787,030,016 bytes [4.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri Sep 1 10:03:43 2023 AEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 117) The previous self-test completed having
the read element of the test failed.
Total time to complete Offline
data collection: (53280) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 532) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x703d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0027 180 174 021 Pre-fail Always - 7983
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 190
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 001 001 000 Old_age Always - 84119
10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 190
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 179
193 Load_Cycle_Count 0x0032 179 179 000 Old_age Always - 63114
194 Temperature_Celsius 0x0022 119 098 000 Old_age Always - 33
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed: read failure 50% 18579 4181840
# 2 Short offline Completed: read failure 40% 18573 4181840
# 3 Short offline Completed: read failure 40% 18567 4181840
# 4 Short offline Completed: read failure 50% 18561 4181840
# 5 Short offline Completed: read failure 40% 18552 4181840
# 6 Short offline Completed: read failure 50% 18546 4181840
# 7 Short offline Completed: read failure 50% 18540 4181840
# 8 Short offline Completed: read failure 50% 18534 4181840
# 9 Short offline Completed: read failure 50% 18528 4181840
#10 Short offline Completed: read failure 50% 18522 4181840
#11 Extended offline Completed without error 00% 18519 -
#12 Short offline Completed without error 00% 18498 -
#13 Short offline Completed without error 00% 18492 -
#14 Short offline Completed without error 00% 18486 -
#15 Short offline Completed without error 00% 18480 -
#16 Short offline Completed without error 00% 18474 -
#17 Short offline Completed without error 00% 18468 -
#18 Short offline Completed without error 00% 18462 -
#19 Short offline Completed without error 00% 18456 -
#20 Short offline Completed without error 00% 18450 -
#21 Short offline Completed without error 00% 18444 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
From the various numbers, it's all good, no read, seek or re-allocated sectors. It does however have various self-test error not being able to complete. I'm puzzled though that it shows that those occurs a while ago (around 18500 hours), but I don't trust those hours value.
But I got an email
`* Device: /dev/da0 [SAT], Self-Test Log error count increased from 0 to 1.`