Warning: ATA error count 0 in SMART Output

[jbbender22]

Hi All,

I recently purchased a pair of SK Hynix Gold S31 SSDs to use as a pool dedicated for my jails. Upon receiving them I did SMART tests in another machine without error so I threw them in my system and proceeded to get things set up. While testing my SMART Report email to make sure these drives showed up, I noticed a strange few lines in the output:

Code:

SMART Error Log Version: 1
Warning: ATA error count 0 inconsistent with error log pointer 1

My TrueNAS system hasn't thrown any errors at me, which is contrary to what I see when I've been looking this up. A lot of the folks with similar lines in their SMART output were using Crucial MX500 drives with buggy firmware, but most, if not all, were actually getting errors reported emailed to them or within the TrueNAS GUI. The drives have been installed for roughly 18 hours or so.

Is this something I should be concerned about? I'm not totally sure how I should read this.

Here's the full output from one of the drives:

Code:

SMART Attributes Data Structure revision number: 0
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000e   166   166   006    Old_age   Always       -       0
  5 Reallocated_Sector_Ct   0x0032   100   100   036    Old_age   Always       -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       19
 12 Power_Cycle_Count       0x0032   100   100   020    Old_age   Always       -       3
100 Unknown_Attribute       0x0032   100   100   000    Old_age   Always       -       0
168 Unknown_Attribute       0x0032   100   100   000    Old_age   Always       -       0
169 Unknown_Attribute       0x0032   100   100   000    Old_age   Always       -       0
171 Unknown_Attribute       0x0032   100   100   000    Old_age   Always       -       0
172 Unknown_Attribute       0x0032   100   100   000    Old_age   Always       -       0
174 Unknown_Attribute       0x0032   100   100   000    Old_age   Always       -       0
175 Program_Fail_Count_Chip 0x0032   100   100   000    Old_age   Always       -       0
176 Erase_Fail_Count_Chip   0x0032   100   100   000    Old_age   Always       -       0
177 Wear_Leveling_Count     0x0032   100   100   000    Old_age   Always       -       0
178 Used_Rsvd_Blk_Cnt_Chip  0x0032   100   100   000    Old_age   Always       -       0
179 Used_Rsvd_Blk_Cnt_Tot   0x0032   100   100   000    Old_age   Always       -       0
180 Unused_Rsvd_Blk_Cnt_Tot 0x0032   100   100   000    Old_age   Always       -       922
184 End-to-End_Error        0x0032   100   100   000    Old_age   Always       -       0
187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always       -       0
188 Command_Timeout         0x0032   100   100   000    Old_age   Always       -       0
194 Temperature_Celsius     0x0022   022   044   000    Old_age   Always       -       22 (Min/Max 21/44)
195 Hardware_ECC_Recovered  0x000e   100   100   000    Old_age   Always       -       0
196 Reallocated_Event_Count 0x0032   100   100   036    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0032   100   100   000    Old_age   Always       -       0
204 Soft_ECC_Correction     0x000e   100   100   000    Old_age   Always       -       456508
212 Unknown_Attribute       0x0032   100   100   000    Old_age   Always       -       14
233 Media_Wearout_Indicator 0x0023   100   100   001    Pre-fail  Always       -       100
234 Unknown_Attribute       0x0032   100   100   000    Old_age   Always       -       0
241 Total_LBAs_Written      0x0032   100   100   000    Old_age   Always       -       0
242 Total_LBAs_Read         0x0032   100   100   000    Old_age   Always       -       0

SMART Error Log Version: 1
Warning: ATA error count 0 inconsistent with error log pointer 1

ATA Error Count: 0
        CR = Command Register [HEX]
        FR = Features Register [HEX]
        SC = Sector Count Register [HEX]
        SN = Sector Number Register [HEX]
        CL = Cylinder Low Register [HEX]
        CH = Cylinder High Register [HEX]
        DH = Device/Head Register [HEX]
        DC = Device Command Register [HEX]
        ER = Error register [HEX]
        ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Extended offline    Completed without error       00%         3         -
# 2  Extended offline    Completed without error       00%         1         -

SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

Am I missing something here? Any insight would be greatly appreciated!