Hi everyone, I have a pool with two mirrored Samsung SSDs. Recently they did not pass an extended smarttest, and pool health changed to unhealthy. Could anyone help me interpret those test results? That would be greatly appreciated. I bought those SSDs in November 21 so they are quite new, I am surprised they would already be degraded and needed replacing?
Output ada1
Output ada2
Output ada1
Code:
root@truenas[~]# smartctl -x /dev/ada1
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE-p10 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: Samsung SSD 870 EVO 1TB
Serial Number: S626NF0R936954B
LU WWN Device Id: 5 002538 f419385a4
Firmware Version: SVT01B6Q
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is: SATA 3.3, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Fri Jun 9 08:40:42 2023 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Read SCT Status failed: Input/output error
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 117) The previous self-test completed having
the read element of the test failed.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 097 097 010 - 35
9 Power_On_Hours -O--CK 097 097 000 - 12594
12 Power_Cycle_Count -O--CK 099 099 000 - 5
177 Wear_Leveling_Count PO--C- 098 098 000 - 40
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 097 097 010 - 35
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 097 097 010 - 35
187 Reported_Uncorrect -O--CK 099 099 000 - 27
190 Airflow_Temperature_Cel -O--CK 070 056 000 - 30
195 Hardware_ECC_Recovered -O-RC- 199 199 000 - 27
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
235 Unknown_Attribute -O--C- 100 100 000 - 0
241 Total_LBAs_Written -O--CK 099 099 000 - 28079840098
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
Device Error Count: 27 (device log contains only the most recent 4 errors)
CR = Command Register
FEATR = Features Register
COUNT = Count (was: Sector Count) Register
LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8
LH = LBA High (was: Cylinder High) Register ] LBA
LM = LBA Mid (was: Cylinder Low) Register ] Register
LL = LBA Low (was: Sector Number) Register ]
DV = Device (was: Device/Head) Register
DC = Device Control Register
ER = Error register
ST = Status register
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 27 [2] occurred at disk power-on lifetime: 12584 hours (524 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
00 -- 51 00 f8 00 00 65 81 a5 a8 40 00 Error: 248 sectors at LBA = 0x6581a5a8 = 1702995368
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
25 00 00 01 00 00 00 65 81 a4 a8 40 00 43d+14:02:17.942 READ DMA EXT
25 00 00 01 00 00 00 65 81 a4 a8 40 00 43d+14:02:17.942 READ DMA EXT
25 00 00 01 00 00 00 65 81 a4 a8 40 00 43d+14:02:17.942 READ DMA EXT
25 00 00 01 00 00 00 65 81 a4 a8 40 00 43d+14:02:17.942 READ DMA EXT
25 00 00 01 00 00 00 65 81 a4 a8 40 00 43d+14:02:17.942 READ DMA EXT
Error 26 [1] occurred at disk power-on lifetime: 12584 hours (524 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
00 -- 51 01 00 00 00 65 81 a4 a8 40 00 Error: 256 sectors at LBA = 0x6581a4a8 = 1702995112
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
25 00 00 01 00 00 00 65 81 a4 a8 40 00 43d+14:02:17.841 READ DMA EXT
25 00 00 01 00 00 00 65 81 a4 a8 40 00 43d+14:02:17.841 READ DMA EXT
25 00 00 01 00 00 00 65 81 a4 a8 40 00 43d+14:02:17.841 READ DMA EXT
25 00 00 01 00 00 00 65 81 a4 a8 40 00 43d+14:02:17.841 READ DMA EXT
25 00 00 00 e8 00 00 65 81 a3 c0 40 00 43d+14:02:17.841 READ DMA EXT
Error 25 [0] occurred at disk power-on lifetime: 12584 hours (524 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
00 -- 51 01 00 00 00 65 81 a4 a8 40 00 Error: 256 sectors at LBA = 0x6581a4a8 = 1702995112
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
25 00 00 01 00 00 00 65 81 a4 a8 40 00 43d+14:02:17.744 READ DMA EXT
25 00 00 01 00 00 00 65 81 a4 a8 40 00 43d+14:02:17.744 READ DMA EXT
25 00 00 01 00 00 00 65 81 a4 a8 40 00 43d+14:02:17.744 READ DMA EXT
25 00 00 00 e8 00 00 65 81 a3 c0 40 00 43d+14:02:17.744 READ DMA EXT
25 00 00 00 f0 00 00 65 81 a2 d0 40 00 43d+14:02:17.744 READ DMA EXT
Error 24 [3] occurred at disk power-on lifetime: 12584 hours (524 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
00 -- 51 01 00 00 00 65 81 a4 a8 40 00 Error: 256 sectors at LBA = 0x6581a4a8 = 1702995112
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
25 00 00 01 00 00 00 65 81 a4 a8 40 00 43d+14:02:17.643 READ DMA EXT
25 00 00 01 00 00 00 65 81 a4 a8 40 00 43d+14:02:17.643 READ DMA EXT
25 00 00 00 e8 00 00 65 81 a3 c0 40 00 43d+14:02:17.643 READ DMA EXT
25 00 00 00 f0 00 00 65 81 a2 d0 40 00 43d+14:02:17.643 READ DMA EXT
25 00 00 00 e8 00 00 65 81 a1 e8 40 00 43d+14:02:17.643 READ DMA EXT
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed: read failure 50% 12585 1702993640
# 2 Extended offline Completed without error 00% 11628 -
# 3 Short offline Completed without error 00% 11626 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
256 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Read SCT Status failed: Input/output error
Read SCT Status failed: Input/output error
SCT (Get) Error Recovery Control command failed
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 5 --- Lifetime Power-On Resets
0x01 0x010 4 12594 --- Power-on Hours
0x01 0x018 6 28079840098 --- Logical Sectors Written
0x01 0x020 6 548948065 --- Number of Write Commands
0x01 0x028 6 5338779547 --- Logical Sectors Read
0x01 0x030 6 67995242 --- Number of Read Commands
0x01 0x038 6 1927000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 27 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 30 --- Current Temperature
0x05 0x020 1 44 --- Highest Temperature
0x05 0x028 1 23 --- Lowest Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 11 --- Number of Hardware Resets
0x06 0x010 4 0 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 1 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 1 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 1 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
Output ada2
Code:
root@truenas[~]# smartctl -x /dev/ada2
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE-p10 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: Samsung SSD 870 EVO 1TB
Serial Number: S626NF0R936940R
LU WWN Device Id: 5 002538 f41938596
Firmware Version: SVT01B6Q
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is: SATA 3.3, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Fri Jun 9 08:43:18 2023 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Read SCT Status failed: Input/output error
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 120) The previous self-test completed having
the read element of the test failed.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 098 098 010 - 19
9 Power_On_Hours -O--CK 097 097 000 - 12594
12 Power_Cycle_Count -O--CK 099 099 000 - 5
177 Wear_Leveling_Count PO--C- 098 098 000 - 46
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 098 098 010 - 19
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 098 098 010 - 19
187 Reported_Uncorrect -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 070 056 000 - 30
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
235 Unknown_Attribute -O--C- 100 100 000 - 0
241 Total_LBAs_Written -O--CK 099 099 000 - 28080514210
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed: read failure 80% 12584 417998152
# 2 Short offline Completed without error 00% 12583 -
# 3 Extended offline Completed: read failure 80% 12583 418013512
# 4 Extended offline Completed: read failure 80% 12578 418013512
# 5 Extended offline Completed: read failure 10% 12578 1469218016
# 6 Extended offline Completed: read failure 10% 11628 1469218016
# 7 Short offline Completed without error 00% 11626 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
256 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Read SCT Status failed: Input/output error
Read SCT Status failed: Input/output error
SCT (Get) Error Recovery Control command failed
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 5 --- Lifetime Power-On Resets
0x01 0x010 4 12594 --- Power-on Hours
0x01 0x018 6 28080514210 --- Logical Sectors Written
0x01 0x020 6 538051747 --- Number of Write Commands
0x01 0x028 6 5364631285 --- Logical Sectors Read
0x01 0x030 6 82292724 --- Number of Read Commands
0x01 0x038 6 2315000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 30 --- Current Temperature
0x05 0x020 1 44 --- Highest Temperature
0x05 0x028 1 23 --- Lowest Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 11 --- Number of Hardware Resets
0x06 0x010 4 0 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 2 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 1 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 1 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
