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Reading SMART info, defective disk?

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lowlytech

Dabbler
Joined
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Messages
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I have been a user of FreeNAS for about 3 months now and really am liking it. I recently upgraded my 4 disks to 4TB drives from 3TB drives after I underestimated my storage needs (was running at 87% capacity). That upgrade went great, resilvering each drive til all 4 drives were back in the pool. Now I am getting what I think is a bad drive and since I am not well versed in FreeBSD (mainly windows background) I wanted to make sure before I tried to return this one drive. It does say the SMART status PASSED, but still shows read errors. Here is the smartctl output of the drive in question.

Code:
root@lcars:~ # smartctl -x /dev/ada3
smartctl 6.5 2016-05-07 r4318 [FreeBSD 11.0-STABLE amd64] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org


=== START OF INFORMATION SECTION ===

Model Family:	 Western Digital Red
Device Model:	 WDC WD40EFRX-68N32N0
Serial Number:	WD-WCC7K0RJ*
LU WWN Device Id: 5 0014ee 2649c58bd
Firmware Version: 82.00A82
User Capacity:	4,000,787,030,016 bytes [4.00 TB]
Sector Sizes:	 512 bytes logical, 4096 bytes physical
Rotation Rate:	5400 rpm
Form Factor:	  3.5 inches
Device is:		In smartctl database [for details use: -P show]
ATA Version is:  ACS-3 T13/2161-D revision 5
SATA Version is:  SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is:	Mon Nov 20 06:50:53 2017 CST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is:  Unavailable
APM feature is:  Unavailable
Rd look-ahead is: Enabled
Write cache is:  Enabled
ATA Security is:  Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled


=== START OF READ SMART DATA SECTION ===

SMART overall-health self-assessment test result: PASSED

General SMART Values:

Offline data collection status:  (0x00) Offline data collection activity
										was never started.
										Auto Offline Data Collection: Disabled.

Self-test execution status:	  ( 115) The previous self-test completed having
									   the read element of the test failed.

Total time to complete Offline
data collection:				(43740) seconds.
Offline data collection
capabilities:					(0x7b) SMART execute Offline immediate.

									   Auto Offline data collection on/off support.
										Suspend Offline collection upon new
										command.
										Offline surface scan supported.
									   Self-test supported.
										Conveyance Self-test supported.
										Selective Self-test supported.

SMART capabilities:			(0x0003) Saves SMART data before entering
										power-saving mode.
										Supports SMART auto save timer.
Error logging capability:		(0x01) Error logging supported.
										General Purpose Logging supported.

Short self-test routine

recommended polling time:		(  2) minutes.
Extended self-test routine
recommended polling time:		( 464) minutes.
Conveyance self-test routine
recommended polling time:		(  5) minutes.
SCT capabilities:			  (0x303d) SCT Status supported.

										SCT Error Recovery Control supported.
										SCT Feature Control supported.
										SCT Data Table supported.


SMART Attributes Data Structure revision number: 16

Vendor Specific SMART Attributes with Thresholds:

ID# ATTRIBUTE_NAME		  FLAGS	VALUE WORST THRESH FAIL RAW_VALUE

  1 Raw_Read_Error_Rate	 POSR-K  200   200   051	-	0
  3 Spin_Up_Time			POS--K   100  253   021	-	0
  4 Start_Stop_Count		-O--CK   100  100   000	-	4
  5 Reallocated_Sector_Ct   PO--CK   200  200   140	-	0
  7 Seek_Error_Rate		 -OSR-K   197  192   000	-	59
  9 Power_On_Hours		  -O--CK   100  100   000	-	109
 10 Spin_Retry_Count		-O--CK   100  253   000	-	0
 11 Calibration_Retry_Count -O--CK   100   253  000	-	0
 12 Power_Cycle_Count	   -O--CK   100  100   000	-	4
192 Power-Off_Retract_Count -O--CK   200  200   000	-	0
193 Load_Cycle_Count		-O--CK  200   200   000	-	3
194 Temperature_Celsius	 -O---K  127   116   000	-	23
196 Reallocated_Event_Count -O--CK   200  200   000	-	0
197 Current_Pending_Sector  -O--CK  200   200   000	-	0
198 Offline_Uncorrectable   ----CK  100   253   000	-	0
199 UDMA_CRC_Error_Count	-O--CK  200   200   000	-	0
200 Multi_Zone_Error_Rate   ---R--  200   200   000	-	1
							||||||_ K auto-keep
							|||||__ C event count
							||||___ R error rate
							|||____ S speed/performance
							||_____ O updated online
							|______ P prefailure warning

General Purpose Log Directory Version 1

SMART		   Log Directory Version 1 [multi-sector log support]

Address	Access  R/W   Size  Description

0x00	  GPL,SL  R/O	  1  Log Directory
0x01		  SL  R/O	  1  Summary SMART error log
0x02		  SL  R/O	  5  Comprehensive SMART error log
0x03	   GPL	 R/O	  6  Ext. Comprehensive SMART error log0x04	  GPL,SL  R/O	  8  Device Statistics log
0x06		  SL  R/O	  1  SMART self-test log
0x07	   GPL	 R/O	  1  Extended self-test log
0x09		  SL  R/W	  1  Selective self-test log
0x10	   GPL	 R/O	  1  SATA NCQ Queued Error log
0x11	   GPL	 R/O	  1  SATA Phy Event Counters log
0x30	  GPL,SL  R/O	  9  IDENTIFY DEVICE data log
0x80-0x9f  GPL,SL  R/W	 16  Host vendor specific log
0xa0-0xa7  GPL,SL  VS	  16  Device vendor specific log
0xa8-0xb6  GPL,SL  VS	   1  Device vendor specific log
0xb7	  GPL,SL  VS	  56  Device vendor specific log
0xbd	  GPL,SL  VS	   1  Device vendor specific log
0xc0	  GPL,SL  VS	   1  Device vendor specific log
0xc1	   GPL	 VS	  93  Device vendor specific log
0xe0	   GPL,SL  R/W	  1  SCT Command/Status
0xe1	  GPL,SL  R/W	  1  SCT Data Transfer


SMART Extended Comprehensive Error Log Version: 1 (6 sectors)

Device Error Count: 3

		CR	 = Command Register
		FEATR  = Features Register
		COUNT  = Count (was: Sector Count) Register
		LBA_48 = Upper bytes of LBA High/Mid/Low Registers ]  ATA-8
		LH	 = LBA High (was: Cylinder High) Register	]   LBA
		LM	 = LBA Mid (was: Cylinder Low) Register	  ] Register
		LL	 = LBA Low (was: Sector Number) Register	 ]
		DV	 = Device (was: Device/Head) Register
		DC	 = Device Control Register
		ER	 = Error register
		ST	 = Status register

Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.


Error 3 [2] occurred at disk power-on lifetime: 34 hours (1 days + 10 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:

  ER -- ST COUNT  LBA_48  LH LM LL DV DC

  -- -- -- == -- == == == -- -- -- -- --

  10 -- 51 00 00 00 01 9a 63 c0 b8 40 00  Error: IDNF at LBA = 0x19a63c0b8 = 6885195960

  Commands leading to the command that caused the error were:

  CR FEATR COUNT  LBA_48  LH LM LL DV DC  Powered_Up_Time  Command/Feature_Name

  -- == -- == -- == == == -- -- -- -- --  ---------------  --------------------

  61 00 30 00 70 00 01 9a 63 c0 b8 40 08	 15:29:15.280  WRITE FPDMA QUEUED
  61 00 08 00 68 00 01 9a 45 0c 58 40 08	 15:29:14.529  WRITE FPDMA QUEUED
  61 00 30 00 60 00 01 42 91 7d c8 40 08	 15:29:12.779  WRITE FPDMA QUEUED
  61 00 28 00 58 00 01 42 65 e1 40 40 08	 15:29:11.029  WRITE FPDMA QUEUED
  61 00 08 00 50 00 01 42 65 e1 38 40 08	 15:29:10.564  WRITE FPDMA QUEUED


Error 2 [1] occurred at disk power-on lifetime: 34 hours (1 days + 10 hours)

  When the command that caused the error occurred, the device was active or idle.


  After command completion occurred, registers were:

  ER -- ST COUNT  LBA_48  LH LM LL DV DC

  -- -- -- == -- == == == -- -- -- -- --

  10 -- 51 00 00 00 01 42 65 e1 28 40 00  Error: IDNF at LBA = 0x14265e128 = 5408940328


  Commands leading to the command that caused the error were:
  CR FEATR COUNT  LBA_48  LH LM LL DV DC  Powered_Up_Time  Command/Feature_Name

  -- == -- == -- == == == -- -- -- -- --  ---------------  --------------------
  61 00 08 00 f8 00 01 42 65 e1 28 40 08	 15:28:43.249  WRITE FPDMA QUEUED
  61 00 08 00 f0 00 01 42 65 e1 20 40 08	 15:28:43.030  WRITE FPDMA QUEUED
  ea 00 00 00 00 00 00 00 00 00 00 40 08	 15:28:38.153  FLUSH CACHE EXT
  61 00 08 00 e0 00 01 d1 c0 bd 90 40 08	 15:28:38.153  WRITE FPDMA QUEUED
  61 00 08 00 d8 00 01 d1 c0 bb 90 40 08	 15:28:38.153  WRITE FPDMA QUEUED


Error 1 [0] occurred at disk power-on lifetime: 34 hours (1 days + 10 hours)

  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:

  ER -- ST COUNT  LBA_48  LH LM LL DV DC

  -- -- -- == -- == == == -- -- -- -- --

  10 -- 51 00 00 00 01 42 65 e0 38 40 00  Error: IDNF at LBA = 0x14265e038 = 5408940088


  Commands leading to the command that caused the error were:
  CR FEATR COUNT  LBA_48  LH LM LL DV DC  Powered_Up_Time  Command/Feature_Name

  -- == -- == -- == == == -- -- -- -- --  ---------------  --------------------

  61 00 08 00 60 00 01 42 65 e0 38 40 08	 15:28:24.402  WRITE FPDMA QUEUED
  ea 00 00 00 00 00 00 00 00 00 00 40 08	 15:28:19.599  FLUSH CACHE EXT
  61 00 08 00 50 00 01 d1 c0 bd 80 40 08	 15:28:19.599  WRITE FPDMA QUEUED
  61 00 08 00 48 00 01 d1 c0 bb 80 40 08	 15:28:19.599  WRITE FPDMA QUEUED
  61 00 08 00 40 00 00 00 40 03 80 40 08	 15:28:19.599  WRITE FPDMA QUEUED


SMART Extended Self-test Log Version: 1 (1 sectors)

Num  Test_Description	Status				  Remaining  LifeTime(hours)  LBA_of_first_error

# 1  Extended offline	Completed: read failure	   30%	  102		 5411793008

SMART Selective self-test log data structure revision number 1

 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS

	1		0		0  Not_testing
	2		0		0  Not_testing
	3		0		0  Not_testing
	4		0		0  Not_testing
	5		0		0  Not_testing

Selective self-test flags (0x0):

  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

SCT Status Version:				  3
SCT Version (vendor specific):	   258 (0x0102)
SCT Support Level:				   1
Device State:						Active (0)
Current Temperature:					23 Celsius
Power Cycle Min/Max Temperature:	 23/32 Celsius
Lifetime	Min/Max Temperature:	 18/34 Celsius
Under/Over Temperature Limit Count:   0/0

Vendor specific:

01 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00
00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00
SCT Temperature History Version:	 2
Temperature Sampling Period:		 1 minute
Temperature Logging Interval:		1 minute
Min/Max recommended Temperature:	  0/65 Celsius
Min/Max Temperature Limit:		   -41/85 Celsius
Temperature History Size (Index):	478 (387)

Index	Estimated Time   Temperature Celsius

 388	2017-11-19 22:53	28  *********
 ...	..( 21 skipped).	..  *********
 410	2017-11-19 23:15	28  *********
 411	2017-11-19 23:16	27  ********
 ...	..( 21 skipped).	..  ********
 433	2017-11-19 23:38	27  ********
 434	2017-11-19 23:39	26  *******
 ...	..( 90 skipped).	..  *******
  47	2017-11-20 01:10	26  *******
  48	2017-11-20 01:11	25  ******
 ...	..(112 skipped).	..  ******
 161	2017-11-20 03:04	25  ******
 162	2017-11-20 03:05	24  *****
 ...	..( 86 skipped).	..  *****
 249	2017-11-20 04:32	24  *****
 250	2017-11-20 04:33	23  ****
 ...	..(136 skipped).	..  ****
 387	2017-11-20 06:50	23  ****


SCT Error Recovery Control:

		  Read:	 70 (7.0 seconds)
		  Write:	 70 (7.0 seconds)



Device Statistics (GP Log 0x04)

Page  Offset Size		Value Flags Description
0x01  =====  =			   =  ===  == General Statistics (rev 1) ==
0x01  0x008  4			   4  ---  Lifetime Power-On Resets
0x01  0x010  4			 109  ---  Power-on Hours
0x01  0x018  6	  4976704856  ---  Logical Sectors Written
0x01  0x020  6		26387266  ---  Number of Write Commands
0x01  0x028  6	  9843422629  ---  Logical Sectors Read
0x01  0x030  6		54547293  ---  Number of Read Commands
0x01  0x038  6	  392400000  ---  Date and Time TimeStamp
0x03  =====  =			  =  ===  == Rotating Media Statistics (rev 1) ==
0x03  0x008  4			 109  ---  Spindle Motor Power-on Hours
0x03  0x010  4			  49  ---  Head Flying Hours
0x03  0x018  4			   4  ---  Head Load Events
0x03  0x020  4			   0  ---  Number of Reallocated Logical Sectors
0x03  0x028  4			  30  ---  Read Recovery Attempts
0x03  0x030  4			   0  ---  Number of Mechanical Start Failures
0x03  0x038  4			   0  ---  Number of Realloc. Candidate Logical Sectors
0x03  0x040  4			   0  ---  Number of High Priority Unload Events
0x04  =====  =			   =  ===  == General Errors Statistics (rev 1) ==
0x04  0x008  4			   3  ---  Number of Reported Uncorrectable Errors
0x04  0x010  4			   2  ---  Resets Between Cmd Acceptance and Completion
0x05  =====  =			   =  ===  == Temperature Statistics (rev 1) ==
0x05  0x008  1			  23  ---  Current Temperature
0x05  0x010  1			  23  ---  Average Short Term Temperature
0x05  0x018  1			   -  ---  Average Long Term Temperature
0x05  0x020  1			  34  ---  Highest Temperature
0x05  0x028  1			  18  ---  Lowest Temperature
0x05  0x030  1			  33  ---  Highest Average Short Term Temperature
0x05  0x038  1			  23  ---  Lowest Average Short Term Temperature
0x05  0x040  1			   -  ---  Highest Average Long Term Temperature
0x05  0x048  1			   -  ---  Lowest Average Long Term Temperature
0x05  0x050  4			   0  ---  Time in Over-Temperature
0x05  0x058  1			  65  ---  Specified Maximum Operating Temperature
0x05  0x060  4			   0  ---  Time in Under-Temperature
0x05  0x068  1			   0  ---  Specified Minimum Operating Temperature
0x06  =====  =			   =  ===  == Transport Statistics (rev 1) ==
0x06  0x008  4			  13  ---  Number of Hardware Resets
0x06  0x010  4			   3  ---  Number of ASR Events
0x06  0x018  4			   0  ---  Number of Interface CRC Errors
								|||_ C monitored condition met
								||__ D supports DSN
								|___ N normalized value
SATA Phy Event Counters (GP Log 0x11)
ID	  Size	 Value  Description
0x0001  2			0  Command failed due to ICRC error
0x0002  2			0  R_ERR response for data FIS
0x0003  2			0  R_ERR response for device-to-host data FIS
0x0004  2			0  R_ERR response for host-to-device data FIS
0x0005  2			0  R_ERR response for non-data FIS
0x0006  2			0  R_ERR response for device-to-host non-data FIS
0x0007  2			0  R_ERR response for host-to-device non-data FIS
0x0008  2			0  Device-to-host non-data FIS retries
0x0009  2			0  Transition from drive PhyRdy to drive PhyNRdy
0x000a  2			1  Device-to-host register FISes sent due to a COMRESET
0x000b  2			0  CRC errors within host-to-device FIS
0x000d  2			0  Non-CRC errors within host-to-device FIS
0x000f  2			0  R_ERR response for host-to-device data FIS, CRC
0x0012  2			0  R_ERR response for host-to-device non-data FIS, CRC
0x8000  4		45934  Vendor specific
 
Last edited by a moderator:

danb35

Hall of Famer
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Aug 16, 2011
Messages
15,281
Code tags, please, and not double-spaced--that's just painful to scroll through.

But your drive failed a SMART self-test seven hours ago (the only SMART test that's been run on the drive, which isn't a good thing, but that's a separate issue). It's also reporting some internal errors. I'd say you're right that it's due for an RMA, unless you can swap it for new from the vendor. Otherwise, WD should let you do an advance RMA, so you get the replacement before you send in your disk. And when you get the replacement, make sure you burn it in and test it thoroughly before putting it into service.
 

lowlytech

Dabbler
Joined
Aug 2, 2017
Messages
31
Thanks for the quick reply. I saw that my copy and paste from PuTTY somehow double spaced itself, sorry about that. Thanks for confirming the fault. I ordered the 4 drives from amazon last week, so I will take it up with them. They were all shipped in their own individual WD box with the suspended support. The other three don't show any signs of read errors yet, hope this isn't going to be a questionable lot, as all 4 are exactly the same manufacture date.
 

danb35

Hall of Famer
Joined
Aug 16, 2011
Messages
15,281
I ordered the 4 drives from amazon last week, so I will take it up with them.
When I got a couple of bad drives from Amazon a few years back, they cross-shipped the replacements--it went smoothly.

But never trust a new drive; always test it first. At a minimum, a long SMART test and a complete run of badblocks (which will probably take about three days on one of those drives), but it would really be better to run it for a couple of weeks testing before putting it into production.
 

lowlytech

Dabbler
Joined
Aug 2, 2017
Messages
31
110 percent agree with the whole testing before putting in production. When I first built the box, I did do the long tests on each of the 3TB drives, even split the order where I got different manufacture dates/lots, but I guess I was in a hurry to get the new 4TB drives going, so I just figured they would be good with my only excuse being it is just my own files and not a customers and I had the old 3tb set to fallback on if really bad things happened. Gotta stop thinking like that..
 
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