Maybe these HGST HE8 drives aren't so great either.
Ok, so here's the latest... I went ahead and built my 3 mirrored drive array using two HGST and one Seagate drives. I tried doing some of the Smart Tests, the conveyance test only works on the Seagate drive. on the HGST drives I get:
Code:
[root@freenas] ~# smartctl -t conveyance /dev/da0
smartctl 6.3 2014-07-26 r3976 [FreeBSD 9.3-RELEASE-p31 amd64] (local build)
Copyright (C) 2002-14, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF OFFLINE IMMEDIATE AND SELF-TEST SECTION ===
Conveyance Self-test functions not supported
Sending command: "Execute SMART Conveyance self-test routine immediately in off-line mode".
Command "Execute SMART Conveyance self-test routine immediately in off-line mode" failed: scsi error aborted command
All drives passed the short test.
I Copied a bunch of test data to the array, and that was successful. I figured with 3 drives in the array, I can play with test data, pull one drive, do the long smart test on it, put it back in the array, (if it passes) pull the next one.. etc. There's no production data at this point so I can be learning more about configuring FreeNas and refine my implementation plan while these long tests are going on.
so far so good... until I looked at my console and noticed this:
/da0 = HGST HE8 drive
/da1 = HGST HE8 drive
/da2 = Seagate Archive drive
The two HGST drives have errors, the Seagate Drive does not.
I ran smartctl -a on each drive to see if it reported any information about the errors.. I don't understand the details of this, but I'm hoping one of the experts here will be able to tell me something. Here are the reports from all 3 drives:
HGST HE8
Code:
[root@freenas] ~# smartctl -a /dev/da0
smartctl 6.3 2014-07-26 r3976 [FreeBSD 9.3-RELEASE-p31 amd64] (local build)
Copyright (C) 2002-14, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: HGST HUH728080ALE600
Serial Number: 2EHS6LGX
LU WWN Device Id: 5 000cca 23bd8a4cc
Firmware Version: A4GNT7J0
User Capacity: 8,001,563,222,016 bytes [8.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 7200 rpm
Form Factor: 3.5 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Feb 9 05:15:31 2016 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 101) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: (1083) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 054 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 100 100 024 Pre-fail Always - 0
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 2
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 020 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 16
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 2
22 Unknown_Attribute 0x0023 100 100 025 Pre-fail Always - 100
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 2
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 2
194 Temperature_Celsius 0x0002 166 166 000 Old_age Always - 36 (Min/Max 22/38)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 7
SMART Error Log Version: 1
ATA Error Count: 7 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 7 occurred at disk power-on lifetime: 15 hours (0 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 41 00 00 00 00 00 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 10 e8 14 5b 40 00 15:04:06.173 READ FPDMA QUEUED
60 00 00 e8 15 5b 40 00 15:04:06.021 READ FPDMA QUEUED
60 00 08 e8 13 5b 40 00 15:04:06.020 READ FPDMA QUEUED
60 00 00 e8 ef 5a 40 00 15:04:06.020 READ FPDMA QUEUED
60 00 10 e8 ee 5a 40 00 15:04:06.018 READ FPDMA QUEUED
Error 6 occurred at disk power-on lifetime: 15 hours (0 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 41 00 00 00 00 00 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 00 e8 a2 5a 40 00 15:04:05.969 READ FPDMA QUEUED
ea 00 00 00 00 00 00 00 15:03:39.015 FLUSH CACHE EXT
61 08 10 98 29 81 40 00 15:03:39.014 WRITE FPDMA QUEUED
61 08 00 98 27 81 40 00 15:03:39.014 WRITE FPDMA QUEUED
61 08 08 98 03 40 40 00 15:03:39.013 WRITE FPDMA QUEUED
Error 5 occurred at disk power-on lifetime: 15 hours (0 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 41 00 00 00 00 00 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 08 e8 fa 59 40 00 14:58:49.824 READ FPDMA QUEUED
60 00 10 e8 fb 59 40 00 14:58:49.824 READ FPDMA QUEUED
60 00 00 e8 f9 59 40 00 14:58:49.824 READ FPDMA QUEUED
2f 00 01 10 00 00 00 00 14:58:49.811 READ LOG EXT
2f 00 01 10 00 00 00 00 14:58:49.811 READ LOG EXT
Error 4 occurred at disk power-on lifetime: 15 hours (0 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 41 00 00 00 00 00 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 00 e8 f9 59 40 00 14:58:49.811 READ FPDMA QUEUED
60 00 10 e8 fb 59 40 00 14:58:49.808 READ FPDMA QUEUED
60 00 08 e8 fa 59 40 00 14:58:49.808 READ FPDMA QUEUED
60 00 10 e8 f7 59 40 00 14:58:49.798 READ FPDMA QUEUED
60 00 08 e8 f6 59 40 00 14:58:49.798 READ FPDMA QUEUED
Error 3 occurred at disk power-on lifetime: 15 hours (0 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 41 00 00 00 00 00 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 08 e8 f6 59 40 00 14:58:49.791 READ FPDMA QUEUED
60 00 10 e8 f7 59 40 00 14:58:49.790 READ FPDMA QUEUED
60 00 00 e8 f5 59 40 00 14:58:49.790 READ FPDMA QUEUED
60 00 00 e8 f4 59 40 00 14:58:49.776 READ FPDMA QUEUED
60 00 10 e8 f3 59 40 00 14:58:49.776 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 15 -
# 2 Short offline Completed without error 00% 2 -
# 3 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
HGST HE8
Code:
[root@freenas] ~# smartctl -a /dev/da1
smartctl 6.3 2014-07-26 r3976 [FreeBSD 9.3-RELEASE-p31 amd64] (local build)
Copyright (C) 2002-14, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: HGST HUH728080ALE600
Serial Number: 2EHS4VEX
LU WWN Device Id: 5 000cca 23bd89e41
Firmware Version: A4GNT7J0
User Capacity: 8,001,563,222,016 bytes [8.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 7200 rpm
Form Factor: 3.5 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Feb 9 05:17:53 2016 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 101) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: (1292) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 054 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 100 100 024 Pre-fail Always - 0
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 1
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 020 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 16
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 1
22 Unknown_Attribute 0x0023 100 100 025 Pre-fail Always - 100
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 1
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 1
194 Temperature_Celsius 0x0002 166 166 000 Old_age Always - 36 (Min/Max 23/39)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 8
SMART Error Log Version: 1
ATA Error Count: 8 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 8 occurred at disk power-on lifetime: 15 hours (0 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 41 00 00 00 00 00 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 18 e8 9c 5a 40 00 15:05:05.922 READ FPDMA QUEUED
61 40 10 b0 86 f9 40 00 15:05:05.906 WRITE FPDMA QUEUED
60 00 08 e8 9a 5a 40 00 15:05:05.906 READ FPDMA QUEUED
61 08 10 00 7e f9 40 00 15:05:05.904 WRITE FPDMA QUEUED
61 08 08 f0 86 f9 40 00 15:05:05.903 WRITE FPDMA QUEUED
Error 7 occurred at disk power-on lifetime: 15 hours (0 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 41 00 00 00 00 00 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 08 e8 9a 5a 40 00 15:04:05.788 READ FPDMA QUEUED
60 00 10 e8 9b 5a 40 00 15:04:05.787 READ FPDMA QUEUED
60 00 00 e8 99 5a 40 00 15:04:05.787 READ FPDMA QUEUED
ea 00 00 00 00 00 00 00 15:03:38.833 FLUSH CACHE EXT
61 08 00 98 29 81 40 00 15:03:38.833 WRITE FPDMA QUEUED
Error 6 occurred at disk power-on lifetime: 14 hours (0 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 41 00 00 00 00 00 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 08 e8 3c 5a 40 00 14:58:49.632 READ FPDMA QUEUED
60 00 00 e8 3b 5a 40 00 14:58:49.631 READ FPDMA QUEUED
2f 00 01 10 00 00 00 00 14:58:49.631 READ LOG EXT
2f 00 01 10 00 00 00 00 14:58:49.631 READ LOG EXT
60 00 08 e8 3a 5a 40 00 14:58:49.628 READ FPDMA QUEUED
Error 5 occurred at disk power-on lifetime: 14 hours (0 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 41 00 00 00 00 00 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 08 e8 3a 5a 40 00 14:58:49.631 READ FPDMA QUEUED
60 00 00 e8 39 5a 40 00 14:58:49.628 READ FPDMA QUEUED
60 00 10 e8 38 5a 40 00 14:58:49.621 READ FPDMA QUEUED
60 00 10 e8 37 5a 40 00 14:58:49.621 READ FPDMA QUEUED
60 00 08 e8 35 5a 40 00 14:58:49.621 READ FPDMA QUEUED
Error 4 occurred at disk power-on lifetime: 14 hours (0 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 41 00 00 00 00 00 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 08 e8 34 5a 40 00 14:58:49.611 READ FPDMA QUEUED
60 00 10 e8 35 5a 40 00 14:58:49.610 READ FPDMA QUEUED
60 00 00 e8 33 5a 40 00 14:58:49.610 READ FPDMA QUEUED
60 00 00 e8 32 5a 40 00 14:58:49.605 READ FPDMA QUEUED
60 00 10 e8 31 5a 40 00 14:58:49.604 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 15 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Seagate Archive
Code:
[root@freenas] ~# smartctl -a /dev/da2
smartctl 6.3 2014-07-26 r3976 [FreeBSD 9.3-RELEASE-p31 amd64] (local build)
Copyright (C) 2002-14, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: ST8000AS0002-1NA17Z
Serial Number: Z840A26X
LU WWN Device Id: 5 000c50 08732fc16
Firmware Version: AR15
User Capacity: 8,001,563,222,016 bytes [8.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5980 rpm
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ACS-3 T13/2161-D revision 3b
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Feb 9 05:20:14 2016 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 932) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SCT capabilities: (0x30a5) SCT Status supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 117 100 006 Pre-fail Always - 143127696
3 Spin_Up_Time 0x0003 099 099 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 2
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 063 060 030 Pre-fail Always - 2014545
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 13
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 2
183 Runtime_Bad_Block 0x0032 100 100 000 Old_age Always - 0
184 End-to-End_Error 0x0032 100 100 099 Old_age Always - 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
188 Command_Timeout 0x0032 100 100 000 Old_age Always - 0
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 064 060 045 Old_age Always - 36 (Min/Max 26/40)
191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 0
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 1
193 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 3
194 Temperature_Celsius 0x0022 036 040 000 Old_age Always - 36 (0 22 0 0 0)
195 Hardware_ECC_Recovered 0x001a 117 100 000 Old_age Always - 143127696
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 1
240 Head_Flying_Hours 0x0000 100 253 000 Old_age Offline - 13 (124 66 0)
241 Total_LBAs_Written 0x0000 100 253 000 Old_age Offline - 4034239292
242 Total_LBAs_Read 0x0000 100 253 000 Old_age Offline - 241586
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Conveyance offline Completed without error 00% 12 -
# 2 Short offline Completed without error 00% 12 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Any suggestions on what I should look at?