Hi,
I'm quickly losing faith in Seagate's Exos X16 12 TB drives, after 2 drives failing on me within 1-4 months. The first drive failed on me after ~100 days (https://www.truenas.com/community/threads/zpool-status-read-errors.98886/), and now the second drive after ~25 days (this thread).
Have a look at the SMART report:
Similar to the previous drive, which @Pitfrr pointed out (over here: https://www.truenas.com/community/threads/zpool-status-read-errors.98886/), this drive also shows a lot of read failures, at the exact same address:
However, a lot more read errors, in a much shorter time span than last time:
And then, like last time, the extended test didn't finish (it's completed but at 90%) and ended with a read failure:
However, unlike last time, the above was not all that scared me. Let me zoom in for you:
Am I correct to assume that '008' in the 'WORST' column means that, at some point, a temperature of 92 degrees Celsius was recorded? For people more familiar with Fahrenheit, that's nearly water boiling temperature. Yikes
. Is Seagate shipping drives with integrated multi-core CPUs now? With the rising energy bills in Europe, I almost wish it was that hot in my house this winter.
Apart from that insane temperature reading, this is getting very symptomatic and worrying to me. Note that I just again ordered a new Seagate Exos X16 12 TB. Yes, again. For 2 reasons:
If the 3rd drive fails again after a few weeks / months, I'll report back. I hope this is all just bad luck, but maybe anyone here has had similar problems with this particular model or other drive models?
I'm quickly losing faith in Seagate's Exos X16 12 TB drives, after 2 drives failing on me within 1-4 months. The first drive failed on me after ~100 days (https://www.truenas.com/community/threads/zpool-status-read-errors.98886/), and now the second drive after ~25 days (this thread).
Have a look at the SMART report:
Code:
# smartctl -a /dev/ada3 smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE-p12 amd64] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Seagate Exos X16 Device Model: ST12000NM001G-2MV103 Serial Number: ZTN0NKEV LU WWN Device Id: 5 000c50 0e32b79b5 Firmware Version: SN03 User Capacity: 12,000,138,625,024 bytes [12.0 TB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: 7200 rpm Form Factor: 3.5 inches Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-4 (minor revision not indicated) SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sat Mar 12 09:42:16 2022 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED See vendor-specific Attribute list for marginal Attributes. General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 121) The previous self-test completed having the read element of the test failed. Total time to complete Offline data collection: ( 567) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: (1080) minutes. Conveyance self-test routine recommended polling time: ( 2) minutes. SCT capabilities: (0x70bd) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported.There are a SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 055 055 044 Pre-fail Always - 235168146 3 Spin_Up_Time 0x0003 098 098 000 Pre-fail Always - 0 4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 3 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 078 060 045 Pre-fail Always - 65196338 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 619 10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 3 18 Head_Health 0x000b 100 100 050 Pre-fail Always - 0 187 Reported_Uncorrect 0x0032 001 001 000 Old_age Always - 575 188 Command_Timeout 0x0032 100 095 000 Old_age Always - 12885164037 190 Airflow_Temperature_Cel 0x0022 070 008 040 Old_age Always In_the_past 30 (Min/Max 28/92 #35) 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 2 193 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 182 194 Temperature_Celsius 0x0022 030 092 000 Old_age Always - 30 (0 17 0 0 0) 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 176 198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 176 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 200 Pressure_Limit 0x0023 100 098 001 Pre-fail Always - 0 240 Head_Flying_Hours 0x0000 100 253 000 Old_age Offline - 606h+10m+35.419s 241 Total_LBAs_Written 0x0000 100 253 000 Old_age Offline - 18937165820 242 Total_LBAs_Read 0x0000 100 253 000 Old_age Offline - 11571499714 SMART Error Log Version: 1 ATA Error Count: 574 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 574 occurred at disk power-on lifetime: 606 hours (25 days + 6 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 00 ff ff ff 4f 00 00:18:33.575 READ DMA EXT 25 00 00 ff ff ff 4f 00 00:18:30.492 READ DMA EXT 25 00 00 ff ff ff 4f 00 00:18:27.343 READ DMA EXT 25 00 00 ff ff ff 4f 00 00:18:24.260 READ DMA EXT 25 00 00 ff ff ff 4f 00 00:18:21.215 READ DMA EXT Error 573 occurred at disk power-on lifetime: 606 hours (25 days + 6 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 00 ff ff ff 4f 00 00:18:30.492 READ DMA EXT 25 00 00 ff ff ff 4f 00 00:18:27.343 READ DMA EXT 25 00 00 ff ff ff 4f 00 00:18:24.260 READ DMA EXT 25 00 00 ff ff ff 4f 00 00:18:21.215 READ DMA EXT 60 00 04 ff ff ff 4f 00 00:18:21.214 READ FPDMA QUEUED Error 572 occurred at disk power-on lifetime: 606 hours (25 days + 6 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 00 ff ff ff 4f 00 00:18:27.343 READ DMA EXT 25 00 00 ff ff ff 4f 00 00:18:24.260 READ DMA EXT 25 00 00 ff ff ff 4f 00 00:18:21.215 READ DMA EXT 60 00 04 ff ff ff 4f 00 00:18:21.214 READ FPDMA QUEUED 2f 00 01 10 00 00 00 00 00:18:21.183 READ LOG EXT Error 571 occurred at disk power-on lifetime: 606 hours (25 days + 6 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 00 ff ff ff 4f 00 00:18:24.260 READ DMA EXT 25 00 00 ff ff ff 4f 00 00:18:21.215 READ DMA EXT 60 00 04 ff ff ff 4f 00 00:18:21.214 READ FPDMA QUEUED 2f 00 01 10 00 00 00 00 00:18:21.183 READ LOG EXT 60 00 04 ff ff ff 4f 00 00:18:18.123 READ FPDMA QUEUED Error 570 occurred at disk power-on lifetime: 606 hours (25 days + 6 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 00 ff ff ff 4f 00 00:18:21.215 READ DMA EXT 60 00 04 ff ff ff 4f 00 00:18:21.214 READ FPDMA QUEUED 2f 00 01 10 00 00 00 00 00:18:21.183 READ LOG EXT 60 00 04 ff ff ff 4f 00 00:18:18.123 READ FPDMA QUEUED 60 00 00 ff ff ff 4f 00 00:18:18.122 READ FPDMA QUEUED SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed: read failure 90% 606 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
Similar to the previous drive, which @Pitfrr pointed out (over here: https://www.truenas.com/community/threads/zpool-status-read-errors.98886/), this drive also shows a lot of read failures, at the exact same address:
Code:
40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455
However, a lot more read errors, in a much shorter time span than last time:
Code:
Error 574 occurred at disk power-on lifetime: 606 hours (25 days + 6 hours)
And then, like last time, the extended test didn't finish (it's completed but at 90%) and ended with a read failure:
Code:
# 1 Extended offline Completed: read failure 90% 606 -
However, unlike last time, the above was not all that scared me. Let me zoom in for you:
Code:
190 Airflow_Temperature_Cel 0x0022 070 008 040 Old_age Always In_the_past 30 (Min/Max 28/92 #35)
Am I correct to assume that '008' in the 'WORST' column means that, at some point, a temperature of 92 degrees Celsius was recorded? For people more familiar with Fahrenheit, that's nearly water boiling temperature. Yikes
Apart from that insane temperature reading, this is getting very symptomatic and worrying to me. Note that I just again ordered a new Seagate Exos X16 12 TB. Yes, again. For 2 reasons:
- To see if this is just really bad luck, or
- To see if this could be the reason why they are currently relatively cheap here (~€ 270 per drive, compared to a WD Red Plus 12 TB for ~€ 330 in The Netherlands).
If the 3rd drive fails again after a few weeks / months, I'll report back. I hope this is all just bad luck, but maybe anyone here has had similar problems with this particular model or other drive models?
Last edited: