StephenFry
Contributor
- Joined
- Apr 9, 2012
- Messages
- 171
I'm playing around with my test system and see that two of the six drives I've just plugged in, report SMART errors, just hours into operation.
Is this something I should keep an eye on, or does it look like a fluke happened 2 hours after I started these drives up?
Here is the smartctl output for one of them:
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0027 168 168 021 Pre-fail Always - 6591
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 36
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 100 253 000 Old_age Always - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 20
10 Spin_Retry_Count 0x0032 100 253 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 35
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 19
193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 115
194 Temperature_Celsius 0x0022 120 117 000 Old_age Always - 30
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 1
200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 2
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 2 occurred at disk power-on lifetime: 2 hours (0 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 00 00 a0 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d6 01 e0 4f c2 a0 00 00:00:36.204 SMART WRITE LOG
b0 d6 01 e0 4f c2 a0 00 00:00:36.196 SMART WRITE LOG
80 45 01 01 44 57 a0 00 00:00:36.189 [VENDOR SPECIFIC]
ec 44 01 01 00 00 a0 00 00:00:36.174 IDENTIFY DEVICE
80 44 00 bf 44 57 a0 00 00:00:33.562 [VENDOR SPECIFIC]
Error 1 occurred at disk power-on lifetime: 2 hours (0 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 00 00 a0 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d6 01 e0 4f c2 a0 00 00:00:36.196 SMART WRITE LOG
80 45 01 01 44 57 a0 00 00:00:36.189 [VENDOR SPECIFIC]
ec 44 01 01 00 00 a0 00 00:00:36.174 IDENTIFY DEVICE
80 44 00 bf 44 57 a0 00 00:00:33.562 [VENDOR SPECIFIC]
b0 d5 01 bf 4f c2 a0 00 00:00:33.561 SMART READ LOG
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Is this something I should keep an eye on, or does it look like a fluke happened 2 hours after I started these drives up?
Here is the smartctl output for one of them:
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0027 168 168 021 Pre-fail Always - 6591
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 36
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 100 253 000 Old_age Always - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 20
10 Spin_Retry_Count 0x0032 100 253 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 35
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 19
193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 115
194 Temperature_Celsius 0x0022 120 117 000 Old_age Always - 30
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 1
200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 2
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 2 occurred at disk power-on lifetime: 2 hours (0 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 00 00 a0 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d6 01 e0 4f c2 a0 00 00:00:36.204 SMART WRITE LOG
b0 d6 01 e0 4f c2 a0 00 00:00:36.196 SMART WRITE LOG
80 45 01 01 44 57 a0 00 00:00:36.189 [VENDOR SPECIFIC]
ec 44 01 01 00 00 a0 00 00:00:36.174 IDENTIFY DEVICE
80 44 00 bf 44 57 a0 00 00:00:33.562 [VENDOR SPECIFIC]
Error 1 occurred at disk power-on lifetime: 2 hours (0 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 00 00 a0 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d6 01 e0 4f c2 a0 00 00:00:36.196 SMART WRITE LOG
80 45 01 01 44 57 a0 00 00:00:36.189 [VENDOR SPECIFIC]
ec 44 01 01 00 00 a0 00 00:00:36.174 IDENTIFY DEVICE
80 44 00 bf 44 57 a0 00 00:00:33.562 [VENDOR SPECIFIC]
b0 d5 01 bf 4f c2 a0 00 00:00:33.561 SMART READ LOG
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.