Pool degraded - was tun?

[diwa_]

Hi Leute,

seit Anfang des Jahres - also jetzt ca. 14 Tage - habe ich auf einem HP N54L die aktuelle Version von freeNAS mit einem aus 5 WD 4TB Red-Platten erstellten Pool am laufen.

Heute Abend erhielt ich per Mail diesen Hinweis:

The volume diwaRaid (ZFS) state is DEGRADED: One or more devices are faulted in response to persistent errors. Sufficient replicas exist for the pool to continue functioning in a degraded state.

Ein zpool status -v ergab:

Code:

 zpool status -v
  pool: Raid
state: DEGRADED
status: One or more devices are faulted in response to persistent errors.
    Sufficient replicas exist for the pool to continue functioning in a
    degraded state.
action: Replace the faulted device, or use 'zpool clear' to mark the device
    repaired.
  scan: resilvered 312G in 1h33m with 0 errors on Thu Dec 31 09:33:47 2015
config:

    NAME                                            STATE     READ WRITE CKSUM
    Raid                                            DEGRADED     0     0     0
      raidz2-0                                      DEGRADED     0     0     0
        gptid/4b3f1ee5-aef6-11e5-a91b-28924a306489  ONLINE       0     0     0
        gptid/79899940-af28-11e5-9750-28924a306489  ONLINE       0     0     0
        gptid/bb6c0513-af0f-11e5-ab3c-28924a306489  FAULTED      2    99     0  too many errors
        gptid/f011085e-af39-11e5-bd46-28924a306489  ONLINE       0     0     0
        gptid/13d889a3-af8c-11e5-b344-28924a306489  ONLINE       0     0     0

errors: No known data errors

Die Platten sind alle neu und aus der gleichen Lieferung ist die hier als dritte Platte gelistete tatsächlich defekt?

An anderer Stelle steht, man solle mittels smartctl -a /dev/adaX eine Diagnose der Platte fahren.

smartctl -a /dev/ada4 liefert Read Device Identity failed: Input/output error
A mandatory SMART command failed: exiting. To continue, add one or more '-T permissive' options.

smartctl -a /dev/ada4 -T permissive liefert:

Code:

=== START OF INFORMATION SECTION ===
Model Family:     Western Digital Red
Device Model:     WDC WD40EFRX-68WT0N0
Serial Number:    WD-WCC4E4SZ2S45
LU WWN Device Id: 5 0014ee 2b733ceee
Firmware Version: 82.00A82
User Capacity:    4,000,787,030,016 bytes [4.00 TB]
Sector Sizes:     512 bytes logical, 4096 bytes physical
Rotation Rate:    5400 rpm
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   ACS-2 (minor revision not indicated)
SATA Version is:  SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is:    Thu Jan 14 22:41:05 2016 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)    Offline data collection activity
                    was never started.
                    Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)    The previous self-test routine completed
                    without error or no self-test has ever
                    been run.
Total time to complete Offline
data collection:         (53520) seconds.
Offline data collection
capabilities:              (0x7b) SMART execute Offline immediate.
                    Auto Offline data collection on/off support.
                    Suspend Offline collection upon new
                    command.
                    Offline surface scan supported.
                    Self-test supported.
                    Conveyance Self-test supported.
                    Selective Self-test supported.
SMART capabilities:            (0x0003)    Saves SMART data before entering
                    power-saving mode.
                    Supports SMART auto save timer.
Error logging capability:        (0x01)    Error logging supported.
                    General Purpose Logging supported.
Short self-test routine
recommended polling time:      (   2) minutes.
Extended self-test routine
recommended polling time:      ( 535) minutes.
Conveyance self-test routine
recommended polling time:      (   5) minutes.
SCT capabilities:            (0x703d)    SCT Status supported.
                    SCT Error Recovery Control supported.
                    SCT Feature Control supported.
                    SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   200   200   051    Pre-fail  Always       -       0
  3 Spin_Up_Time            0x0027   199   199   021    Pre-fail  Always       -       7050
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       12
  5 Reallocated_Sector_Ct   0x0033   200   200   140    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x002e   100   253   000    Old_age   Always       -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       341
10 Spin_Retry_Count        0x0032   100   253   000    Old_age   Always       -       0
11 Calibration_Retry_Count 0x0032   100   253   000    Old_age   Always       -       0
12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       6
192 Power-Off_Retract_Count 0x0032   200   200   000    Old_age   Always       -       0
193 Load_Cycle_Count        0x0032   200   200   000    Old_age   Always       -       24
194 Temperature_Celsius     0x0022   121   118   000    Old_age   Always       -       31
196 Reallocated_Event_Count 0x0032   200   200   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0032   200   200   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   100   253   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0032   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x0008   100   253   000    Old_age   Offline      -       0

SMART Error Log Version: 1
ATA Error Count: 10 (device log contains only the most recent five errors)
    CR = Command Register [HEX]
    FR = Features Register [HEX]
    SC = Sector Count Register [HEX]
    SN = Sector Number Register [HEX]
    CL = Cylinder Low Register [HEX]
    CH = Cylinder High Register [HEX]
    DH = Device/Head Register [HEX]
    DC = Device Command Register [HEX]
    ER = Error register [HEX]
    ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 10 occurred at disk power-on lifetime: 341 hours (14 days + 5 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 10 90 02 40 e0  Error: UNC 16 sectors at LBA = 0x00400290 = 4194960

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 10 90 02 40 e0 00   7d+11:58:10.726  READ DMA
  c8 00 10 90 02 40 e0 00   7d+11:58:03.660  READ DMA
  c8 00 10 90 02 40 e0 00   7d+11:57:56.595  READ DMA
  c8 00 10 90 02 40 e0 00   7d+11:57:49.529  READ DMA
  c8 00 10 90 02 40 e0 00   7d+11:57:42.464  READ DMA

Error 9 occurred at disk power-on lifetime: 341 hours (14 days + 5 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 10 90 02 40 e0  Error: UNC 16 sectors at LBA = 0x00400290 = 4194960

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 10 90 02 40 e0 00   7d+11:58:03.660  READ DMA
  c8 00 10 90 02 40 e0 00   7d+11:57:56.595  READ DMA
  c8 00 10 90 02 40 e0 00   7d+11:57:49.529  READ DMA
  c8 00 10 90 02 40 e0 00   7d+11:57:42.464  READ DMA

Error 8 occurred at disk power-on lifetime: 341 hours (14 days + 5 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 10 90 02 40 e0  Error: UNC 16 sectors at LBA = 0x00400290 = 4194960

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 10 90 02 40 e0 00   7d+11:57:56.595  READ DMA
  c8 00 10 90 02 40 e0 00   7d+11:57:49.529  READ DMA
  c8 00 10 90 02 40 e0 00   7d+11:57:42.464  READ DMA

Error 7 occurred at disk power-on lifetime: 341 hours (14 days + 5 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 10 90 02 40 e0  Error: UNC 16 sectors at LBA = 0x00400290 = 4194960

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 10 90 02 40 e0 00   7d+11:57:49.529  READ DMA
  c8 00 10 90 02 40 e0 00   7d+11:57:42.464  READ DMA

Error 6 occurred at disk power-on lifetime: 341 hours (14 days + 5 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 10 90 02 40 e0  Error: UNC 16 sectors at LBA = 0x00400290 = 4194960

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 10 90 02 40 e0 00   7d+11:57:42.464  READ DMA

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]

SMART Selective self-test log data structure revision number 1
SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

Viele böhmische Dörfer...

Any hints?

Danke

dirk

 

[warri]

Die SMART Werte selber sehen soweit gut aus, aber es wurden einige ATA Fehler geloggt.
Du solltest einen SMART Test laufen lassen und das Ergebnis abwarten (dauert einige Stunden):

smartctl -t long /dev/ada4​

Wenn das Ergebnis des Tests ebenfalls auf eine kaputte Festplatte hindeutet, solltest du sie ohne Probleme unter Garantie austauschen können. Prüfe auch mal, ob die Kabel bei der Festplatte richtig sitzen.

Nächster Schritt ist dann natürlich der zügige Austausch, aber da du ein RAID-Z2 konfiguriert hast ist der Verlust einer einzigen Festplatte zum Glück nicht kritisch.

 

[diwa_]

smartctl -t long /dev/ada4 läuft schon seit gestern Abend.
Die Schätzung meine, es dauere bis 7:30 - als ich um 8:00 das Ergebnis anzeigen lassen wollte, stand dann da "abgebrochen".
Also noch mal - erwartetes Ende: 17:30

Gibt es eine Möglichkeit, den Status des laufenden Tests zu sehen?

Was mir an den SMART Werten nicht gefällt ist
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0

Das scheint mir recht viel für 14 Tage Laufzeit.

ciao

dirk

 

[diwa_]

Eben gerade kam Post von meinem freeNAS:

Device: /dev/ada4, ATA error count increased from 10 to 14
The volume Raid (ZFS) state is DEGRADED: One or more devices are faulted in response to persistent errors. Sufficient replicas exist for the pool to continue functioning in a degraded state.
Device: /dev/ada4, not capable of SMART self-check
Device: /dev/ada4, ATA error count increased from 0 to 10

"not capable of SMART self-check" hört sich nicht gut an...

Ciao

dirk

 

[Gen8 Runner]

Sounds not really good, wenn ich das richtig interpretiere.

Würde die Platte durch eine andere ersetzen.
Anschließend kannst du die natürlich in einem anderen externen Gehäuse nochmal platt machen, komplett auf Fehler checken /Smart-Test durchführen und anschließend entscheiden, ob die noch einsatzfähig ist oder nur noch als Briefbeschwerer taugt. Dein Pool läuft aber noch der Fehlermeldung nach, richtig?

 

[diwa_]

Ja, der Pool läuft noch. EINE Platte darf noch kaputt gehen.
Eine neue als Ersatz ist schon bestellt. Unabhängig davon, ob/dass die defekte durch den Verkäufer getauscht werden muss.

Ciao

dirk

 

[warri]

Hi Dirk, dass der Smart Test fehlschlägt, klingt in der Tat nicht gut für die Festplatte.

Was mir an den SMART Werten nicht gefällt ist

Code:

 5 Reallocated_Sector_Ct   0x0033   200   200   140    Pre-fail  Always       -       0

Das scheint mir recht viel für 14 Tage Laufzeit.

Der Wert ist auf 0 - genau wo er sein sollte. Beim Lesen in die falsche Reihe/Spalte gerutscht?

 

[diwa_]

schief geschaut...

Hier das Ergebnis von smartctl nach dem kompletten scan:

Code:

 smartctl -a /dev/ada4
smartctl 6.3 2014-07-26 r3976 [FreeBSD 9.3-RELEASE-p28 amd64] (local build)
Copyright (C) 2002-14, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:     Western Digital Red
Device Model:     WDC WD40EFRX-68WT0N0
Serial Number:    WD-WCC4E4SZ2S45
LU WWN Device Id: 5 0014ee 2b733ceee
Firmware Version: 82.00A82
User Capacity:    4,000,787,030,016 bytes [4.00 TB]
Sector Sizes:     512 bytes logical, 4096 bytes physical
Rotation Rate:    5400 rpm
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   ACS-2 (minor revision not indicated)
SATA Version is:  SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is:    Fri Jan 15 21:03:14 2016 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)    Offline data collection activity
                    was never started.
                    Auto Offline Data Collection: Disabled.
Self-test execution status:      (  41)    The self-test routine was interrupted
                    by the host with a hard or soft reset.
Total time to complete Offline
data collection:         (53520) seconds.
Offline data collection
capabilities:              (0x7b) SMART execute Offline immediate.
                    Auto Offline data collection on/off support.
                    Suspend Offline collection upon new
                    command.
                    Offline surface scan supported.
                    Self-test supported.
                    Conveyance Self-test supported.
                    Selective Self-test supported.
SMART capabilities:            (0x0003)    Saves SMART data before entering
                    power-saving mode.
                    Supports SMART auto save timer.
Error logging capability:        (0x01)    Error logging supported.
                    General Purpose Logging supported.
Short self-test routine
recommended polling time:      (   2) minutes.
Extended self-test routine
recommended polling time:      ( 535) minutes.
Conveyance self-test routine
recommended polling time:      (   5) minutes.
SCT capabilities:            (0x703d)    SCT Status supported.
                    SCT Error Recovery Control supported.
                    SCT Feature Control supported.
                    SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   200   200   051    Pre-fail  Always       -       0
  3 Spin_Up_Time            0x0027   199   199   021    Pre-fail  Always       -       7050
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       12
  5 Reallocated_Sector_Ct   0x0033   200   200   140    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x002e   200   200   000    Old_age   Always       -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       364
10 Spin_Retry_Count        0x0032   100   253   000    Old_age   Always       -       0
11 Calibration_Retry_Count 0x0032   100   253   000    Old_age   Always       -       0
12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       6
192 Power-Off_Retract_Count 0x0032   200   200   000    Old_age   Always       -       0
193 Load_Cycle_Count        0x0032   200   200   000    Old_age   Always       -       59
194 Temperature_Celsius     0x0022   121   118   000    Old_age   Always       -       31
196 Reallocated_Event_Count 0x0032   200   200   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0032   200   200   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   100   253   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0032   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x0008   100   253   000    Old_age   Offline      -       0

SMART Error Log Version: 1
ATA Error Count: 15 (device log contains only the most recent five errors)
    CR = Command Register [HEX]
    FR = Features Register [HEX]
    SC = Sector Count Register [HEX]
    SN = Sector Number Register [HEX]
    CL = Cylinder Low Register [HEX]
    CH = Cylinder High Register [HEX]
    DH = Device/Head Register [HEX]
    DC = Device Command Register [HEX]
    ER = Error register [HEX]
    ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 15 occurred at disk power-on lifetime: 357 hours (14 days + 21 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 20 38 15 00 e0  Error: UNC 32 sectors at LBA = 0x00001538 = 5432

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 20 38 15 00 e0 00   8d+04:18:19.689  READ DMA
  c8 00 58 10 19 00 e0 00   8d+04:18:15.906  READ DMA
  c8 00 30 d0 08 00 e0 00   8d+04:18:13.379  READ DMA
  c8 00 30 50 09 00 e0 00   8d+04:18:13.245  READ DMA
  c8 00 40 10 09 00 e0 00   8d+04:18:13.189  READ DMA

Error 14 occurred at disk power-on lifetime: 353 hours (14 days + 17 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  10 51 80 80 09 00 e0  Error: IDNF at LBA = 0x00000980 = 2432

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ca 00 80 80 09 00 e0 00   8d+00:35:47.573  WRITE DMA
  ca 00 30 b8 03 00 e0 00   8d+00:34:17.658  WRITE DMA
  ca 00 80 00 09 00 e0 00   8d+00:34:17.658  WRITE DMA
  ca 00 08 20 01 00 e0 00   8d+00:34:17.655  WRITE DMA
  ca 00 08 f0 00 00 e0 00   8d+00:34:17.655  WRITE DMA

Error 13 occurred at disk power-on lifetime: 353 hours (14 days + 17 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  10 51 38 80 03 00 e0  Error: IDNF at LBA = 0x00000380 = 896

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ca 00 38 80 03 00 e0 00   8d+00:34:10.596  WRITE DMA
  ca 00 50 20 05 00 e0 00   8d+00:32:57.499  WRITE DMA
  ca 00 80 b8 07 00 e0 00   8d+00:32:57.497  WRITE DMA
  ca 00 08 e0 00 00 e0 00   8d+00:32:57.494  WRITE DMA
  ca 00 80 00 07 00 e0 00   8d+00:32:57.494  WRITE DMA

Error 12 occurred at disk power-on lifetime: 353 hours (14 days + 17 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  10 51 80 80 03 00 e0  Error: IDNF at LBA = 0x00000380 = 896

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ca 00 80 80 03 00 e0 00   8d+00:32:50.419  WRITE DMA
  ca 00 70 00 06 00 e0 00   8d+00:31:21.407  WRITE DMA
  ca 00 80 80 05 00 e0 00   8d+00:31:21.398  WRITE DMA
  ca 00 10 b0 01 00 e0 00   8d+00:31:21.390  WRITE DMA
  ca 00 08 e8 00 00 e0 00   8d+00:31:21.390  WRITE DMA

Error 11 occurred at disk power-on lifetime: 353 hours (14 days + 17 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  10 51 58 80 03 00 e0  Error: IDNF at LBA = 0x00000380 = 896

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ca 00 58 80 03 00 e0 00   8d+00:31:14.334  WRITE DMA
  b0 d5 01 01 4f c2 e0 00   8d+00:29:49.167  SMART READ LOG
  b0 d5 01 06 4f c2 e0 00   8d+00:29:49.123  SMART READ LOG
  b0 d0 01 00 4f c2 e0 00   8d+00:29:48.969  SMART READ DATA
  ca 00 08 e0 00 00 e0 00   8d+00:29:48.860  WRITE DMA

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Extended captive    Interrupted (host reset)      90%       352         -
# 2  Extended captive    Interrupted (host reset)      90%       341         -

SMART Selective self-test log data structure revision number 1
SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

Kann es sich u.U. um ein Kabelproblem handeln? Diese Platte ist beim HP N54L im Schacht des optischen Laufwerks montiert...

Ciao

dirk

 

[warri]

Beide Tests sind nicht ganz durchgelaufen:

Code:

 
SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Extended captive    Interrupted (host reset)      90%       352         -
# 2  Extended captive    Interrupted (host reset)      90%       341         -

Da du nur ATA Fehler siehst, könnte es in der Tat ein Problem mit der Verkablung sein. 'Host reset' kann bedeuten, dass die Stromversorgung kurz ausgefallen ist. Wenn möglich mal Strom- und SATA-Kabel austauschen, oder die Festplatte in einem anderen Computer testen.

 

[Roman]

Was auch gut sein kann, ist, dass die Backplane, sofern vorhanden, kaputt ist. Das ist mir einmal passiert. Es war eine Backplane eines Chenbro-Servers. Genau bei einer einzigen Platte tauchten etliche Fehler auf. Die Platte selbst war aber zu 100% in Ordnung und lebt heute noch.

Nur so als kleiner Tipp.

 

[diwa_]

Die betroffene Platte hängt per Kabel am SATA Anschluss für das optische Laufwerk.
Ich habe sie heute gegen eine neue ausgetauscht, Resilvering läuft...
Der externe SMART-Test mit der "defekten" Platte zeigte keine Fehler.

Neue Strom- und SATA- Kabel in der passenden Länge sind bestellt...

Ciao

dirk

 

[xaibex]

Die Smart Fehler klingen in der Tat nach einem Fehler bei Datenübertragung. Also Verkabelung, Stecker, Backbone etc.

Einfacher Vorschlag: Tausche mal den Platz der betroffenen und der nicht betroffenen Platte. Wenn der fehler dann bei der getauschten ebenso auftritt kannst du dir sicher sein dass es nicht an der platte sondern an verkabelung etc. liegt.

 

[diwa_]

In der Zwischenzeit ist die Platte getauscht.
Die "defekte" Platte habe ich dann noch mal an einem anderem Rechner getestet und dort meldet sie "zu viele Lesefehler" weswegen der SMART-Test abgebrochen wurde.
Inzwischen ist sie schon wieder beim Händler und ich warte auf eine Austauschplatte...

Ciao

dirk